[HTML][HTML] Bandgap engineering in III-nitrides with boron and group V elements: Toward applications in ultraviolet emitters

R Kudrawiec, D Hommel - Applied Physics Reviews, 2020 - pubs.aip.org
A key material system for opto-and high-power electronics are III-nitrides. Their functionality
can be expanded when bandgap engineering is extended beyond common materials such …

[HTML][HTML] Electronic and optical properties of boron-containing GaN alloys: The role of boron atom clustering

CL Nies, TP Sheerin, S Schulz - APL Materials, 2023 - pubs.aip.org
Boron (B) containing III-nitride materials, such as wurtzite (wz)(B, Ga) N alloys, have recently
attracted significant interest due to their ability to tailor the electronic and optical properties of …

Epitaxial growth of metastable semiconductor alloys

GB Stringfellow - Journal of Crystal Growth, 2021 - Elsevier
The desire to access new alloys with desirable properties for semiconductor devices has
moved the field of semiconductor epitaxial growth into the region of metastable alloys, ie …

Effective neutron detection using vertical-type BGaN diodes

T Nakano, K Mochizuki, T Arikawa… - Journal of Applied …, 2021 - pubs.aip.org
In this study, vertical-type thick BGaN PIN diodes were successfully fabricated to improve the
neutron capture rate of BGaN diodes by improving the BGaN epitaxial growth technique. In …

The lattice-matched AlInN/GaN high electron mobility transistor with BGaN buffer

L Geng, H Zhao, T Han, X Ren - Solid State Communications, 2021 - Elsevier
This work studies the lattice-matched AlInN/GaN high-electron mobility transistor (HEMT)
with BGaN buffer in drain-current (DC) and radio-frequency (RF) characteristics in theory …

Nanometer scale composition study of MBE grown BGaN performed by atom probe tomography

B Bonef, R Cramer, JS Speck - Journal of Applied Physics, 2017 - pubs.aip.org
Laser assisted atom probe tomography is used to characterize the alloy distribution in
BGaN. The effect of the evaporation conditions applied on the atom probe specimens on the …

[HTML][HTML] DC and RF characteristics optimization of AlGaN/GaN/BGaN/GaN/Si HEMT for microwave-power and high temperature application

M Gassoumi, A Helali, H Maaref, M Gassoumi - Results in Physics, 2019 - Elsevier
Abstract AlGaN/GaN/Si high electron mobility transistors (HEMTs) developed by molecular
beam epitaxy (MBE) are studied with several methods for characterization, the most utilized …

[HTML][HTML] Neutron detection using boron gallium nitride semiconductor material

K Atsumi, Y Inoue, H Mimura, T Aoki, T Nakano - APL Materials, 2014 - pubs.aip.org
In this study, we developed a new neutron-detection device using a boron gallium nitride
(BGaN) semiconductor in which the B atom acts as a neutron converter. BGaN and gallium …

Optical and structural properties of BGaN layers grown on different substrates

A Kadys, J Mickevičius, T Malinauskas… - Journal of Physics D …, 2015 - iopscience.iop.org
Growth of BGaN epitaxial layers by metalorganic chemical vapor deposition (MOCVD) using
triethylboron (TEB) as a boron source was studied on 6H-SiC substrate and on GaN and AlN …

Physics based modeling of AlGaN/BGaN quantum well based ultra violet light emitting diodes

M Manikandan, D Nirmal, J Ajayan… - optical and quantum …, 2022 - Springer
This work investigates the multiple quantum well ultraviolet light emitting diode (LED) with
AlGaN/BGaN/AlGaN active stack layers. The thickness and the boron concentration of BGaN …