Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends

V Miikkulainen, M Leskelä, M Ritala… - Journal of Applied …, 2013 - pubs.aip.org
Atomic layer deposition (ALD) is gaining attention as a thin film deposition method, uniquely
suitable for depositing uniform and conformal films on complex three-dimensional …

Plasma-assisted atomic layer deposition: basics, opportunities, and challenges

HB Profijt, SE Potts, MCM Van de Sanden… - Journal of Vacuum …, 2011 - pubs.aip.org
Plasma-assisted atomic layer deposition (ALD) is an energy-enhanced method for the
synthesis of ultra-thin films with Å-level resolution in which a plasma is employed during one …

[HTML][HTML] Status and prospects of plasma-assisted atomic layer deposition

H Knoops, T Faraz, K Arts, WMM Kessels - Journal of Vacuum Science …, 2019 - pubs.aip.org
Processing at the atomic scale is becoming increasingly critical for state-of-the-art electronic
devices for computing and data storage, but also for emerging technologies such as related …

[HTML][HTML] Conductive nitrides: Growth principles, optical and electronic properties, and their perspectives in photonics and plasmonics

P Patsalas, N Kalfagiannis, S Kassavetis… - Materials Science and …, 2018 - Elsevier
The nitrides of most of the group IVb-Vb-VIb transition metals (TiN, ZrN, HfN, VN, NbN, TaN,
MoN, WN) constitute the unique category of conductive ceramics. Having substantial …

[HTML][HTML] Applications and techniques for fast machine learning in science

AMC Deiana, N Tran, J Agar, M Blott… - Frontiers in big …, 2022 - frontiersin.org
In this community review report, we discuss applications and techniques for fast machine
learning (ML) in science—the concept of integrating powerful ML methods into the real-time …

In situ spectroscopic ellipsometry as a versatile tool for studying atomic layer deposition

E Langereis, SBS Heil, HCM Knoops… - Journal of Physics D …, 2009 - iopscience.iop.org
In this paper recent work on the application of in situ spectroscopic ellipsometry (SE) during
thin film synthesis by atomic layer deposition (ALD) is reviewed. In particular, the versatility …

Residual stresses in deposited thin-film material layers for micro-and nano-systems manufacturing

M Huff - Micromachines, 2022 - mdpi.com
This review paper covers a topic of significant importance in micro-and nano-systems
development and manufacturing, specifically the residual stresses in deposited thin-film …

Atomic layer etching: What can we learn from atomic layer deposition?

T Faraz, F Roozeboom, HCM Knoops… - ECS Journal of Solid …, 2015 - iopscience.iop.org
Current trends in semiconductor device manufacturing impose extremely stringent
requirements on nanoscale processing techniques, both in terms of accurately controlling …

Nitrogen-rich transition metal nitrides

A Salamat, AL Hector, P Kroll, PF McMillan - Coordination Chemistry …, 2013 - Elsevier
The solid state chemistry leading to the synthesis and characterization of metal nitrides with
N: M ratios> 1 is summarized. Studies of these compounds represent an emerging area of …

Influence of oxygen exposure on the nucleation of platinum atomic layer deposition: consequences for film growth, nanopatterning, and nanoparticle synthesis

AJM Mackus, MA Verheijen, N Leick, AA Bol… - Chemistry of …, 2013 - ACS Publications
Control of the nucleation behavior during atomic layer deposition (ALD) of metals is of great
importance for the deposition of metallic thin films and nanoparticles, and for nanopatterning …