Learning a convolutional neural network for non-uniform motion blur removal
In this paper, we address the problem of estimating and removing non-uniform motion blur
from a single blurry image. We propose a deep learning approach to predicting the …
from a single blurry image. We propose a deep learning approach to predicting the …
A technical survey on delay defects in nanoscale digital VLSI circuits
P Muthukrishnan, S Sathasivam - Applied Sciences, 2022 - mdpi.com
As technology scales down, digital VLSI circuits are prone to many manufacturing defects.
These defects may result in functional and delay-related circuit failures. The number of test …
These defects may result in functional and delay-related circuit failures. The number of test …
Synchronous subnanosecond clock and data recovery for optically switched data centres using clock phase caching
The rapid growth in the amount of data being transferred within data centres, combined with
the slowdown in Moore's Law, creates challenges for the future scalability of electronically …
the slowdown in Moore's Law, creates challenges for the future scalability of electronically …
Dynamic thermal management for FinFET-based circuits exploiting the temperature effect inversion phenomenon
Due to limits on the availability of the energy source in many mobile user platforms (ranging
from handheld devices to portable electronics to deeply embedded devices) and concerns …
from handheld devices to portable electronics to deeply embedded devices) and concerns …
Effect of NBTI/PBTI aging and process variations on write failures in MOSFET and FinFET flip-flops
The assessment of noise margins and the related probability of failure in digital cells has
growingly become essential, as nano-scale MOSFET and FinFET technologies are …
growingly become essential, as nano-scale MOSFET and FinFET technologies are …
Robust logic circuits design using SOI shorted-gate FinFETs
The scaling of planar Metal Oxide Semiconductor Field Effect Transistor (MOSFET)
technology has reached to its extremity. Double Gate (DG) device was introduced to derive …
technology has reached to its extremity. Double Gate (DG) device was introduced to derive …
TEI-Turbo: Temperature effect inversion-aware turbo boost for finfet-based multi-core systems
E Cai, D Marculescu - 2015 IEEE/ACM International …, 2015 - ieeexplore.ieee.org
Energy and temperature are the main constraints for modern high-performance multi-core
systems. To save power or increase performance, Dynamic Voltage and Frequency Scaling …
systems. To save power or increase performance, Dynamic Voltage and Frequency Scaling …
Exploring aging deceleration in FinFET-based multi-core systems
E Cai, D Stamoulis… - 2016 IEEE/ACM …, 2016 - ieeexplore.ieee.org
Power and thermal issues are the main constraints for high-performance multi-core systems.
As the current technology of choice, FinFET is observed to have lower delay under higher …
As the current technology of choice, FinFET is observed to have lower delay under higher …
TEI-power: Temperature Effect Inversion--Aware Dynamic Thermal Management
FinFETs have emerged as a promising replacement for planar CMOS devices in sub-20nm
technology nodes. However, based on the temperature effect inversion (TEI) phenomenon …
technology nodes. However, based on the temperature effect inversion (TEI) phenomenon …
Temperature effect inversion-aware power-performance optimization for FinFET-based multicore systems
E Cai, D Marculescu - … on Computer-Aided Design of Integrated …, 2017 - ieeexplore.ieee.org
Energy and temperature are the main constraints for modern high-performance multicore
systems. To save power or increase performance, dynamic voltage and frequency scaling …
systems. To save power or increase performance, dynamic voltage and frequency scaling …