A review of mechanical and electromechanical properties of piezoelectric nanowires

HD Espinosa, RA Bernal… - Advanced …, 2012 - Wiley Online Library
Piezoelectric nanowires are promising building blocks in nanoelectronic, sensing, actuation
and nanogenerator systems. In spite of great progress in synthesis methods, quantitative …

Three-dimensional nanoscale characterisation of materials by atom probe tomography

A Devaraj, DE Perea, J Liu, LM Gordon… - International …, 2018 - Taylor & Francis
The development of three-dimensional (3-D), characterisation techniques with high spatial
and mass resolution is crucial for understanding and developing advanced materials for …

Atom probe tomography 2012

TF Kelly, DJ Larson - Annual review of materials research, 2012 - annualreviews.org
In the world of tomographic imaging, atom probe tomography (APT) occupies the high-
spatial-resolution end of the spectrum. It is highly complementary to electron tomography …

Doping of semiconductor nanowires

J Wallentin, MT Borgström - Journal of Materials Research, 2011 - cambridge.org
A cornerstone in the successful application of semiconductor nanowire devices is controlled
impurity doping. In this review article, we discuss the key results in the field of semiconductor …

[HTML][HTML] Effects of detector dead-time on quantitative analyses involving boron and multi-hit detection events in atom probe tomography

F Meisenkothen, EB Steel, TJ Prosa, KT Henry… - Ultramicroscopy, 2015 - Elsevier
In atom probe tomography (APT), some elements tend to field evaporate preferentially in
multi-hit detection events. Boron (B) is one such element. It is thought that a large fraction of …

Effects of Cr on the properties of multicomponent cobalt-based superalloys with ultra high γ'volume fraction

DW Chung, JP Toinin, EA Lass, DN Seidman… - Journal of Alloys and …, 2020 - Elsevier
Chromium is known to confer oxidation resistance on Co-based superalloys. Herein we
studied the influence of Cr concentration on the properties of a Co-based superalloy, Co …

[图书][B] Metrology and Diagnostic Techniques for Nanoelectronics

Z Ma, DG Seiler - 2017 - taylorfrancis.com
Nanoelectronics is changing the way the world communicates, and is transforming our daily
lives. Continuing Moore's law and miniaturization of low-power semiconductor chips with …

Nanoscale light element identification using machine learning aided STEM-EDS

HK Kim, HY Ha, JH Bae, MK Cho, J Kim, J Han… - Scientific reports, 2020 - nature.com
Light element identification is necessary in materials research to obtain detailed insight into
various material properties. However, reported techniques, such as scanning transmission …

Characterizing atomic composition and dopant distribution in wide band gap semiconductor nanowires using laser-assisted atom probe tomography

R Agrawal, RA Bernal, D Isheim… - The Journal of Physical …, 2011 - ACS Publications
Characterization of atomic composition and spatially resolved dopant distribution in wide
band gap semiconducting nanowires is critical for their applications in next-generation …

Dopant, composition and carrier profiling for 3D structures

W Vandervorst, C Fleischmann, J Bogdanowicz… - Materials Science in …, 2017 - Elsevier
With the transition from planar to three-dimensional device architectures, devices such as
FinFETs, TFETs and nanowires etc. become omnipresent. This requires the dopant atom …