Reliability challenges with self-heating and aging in finfet technology
The introduction of FinFET technology as an effective solution to continue technology
scaling has pushed self-heating effects to the forefront of reliability challenges, especially at …
scaling has pushed self-heating effects to the forefront of reliability challenges, especially at …
Bti and hcd degradation in a complete 32× 64 bit sram array–including sense amplifiers and write drivers–under processor activity
VM van Santen, S Thomann… - 2020 IEEE …, 2020 - ieeexplore.ieee.org
For the first time, we present a study of BTI and HCD degradation in a 32× 64 cell SRAM
array including Sense Amplifiers (SA), Write Drivers (WD) and pre-charging circuitry (one …
array including Sense Amplifiers (SA), Write Drivers (WD) and pre-charging circuitry (one …
Special session: Machine learning for semiconductor test and reliability
With technology scaling approaching atomic levels, IC test and diagnosis of complex System-
on-Chips (SoCs) become overwhelming challenging. In addition, sustaining the reliability of …
on-Chips (SoCs) become overwhelming challenging. In addition, sustaining the reliability of …
An automated setup for the characterization of time-based degradation effects including the process variability in 40-nm CMOS transistors
This article reports a test chip design in commercial 40-nm process technology to
characterize the level of time-based degradation in metal-oxide-semiconductor field-effect …
characterize the level of time-based degradation in metal-oxide-semiconductor field-effect …
Variability-aware approximate circuit synthesis via genetic optimization
One of the major barriers that CMOS devices face at nanometer scale is increasing
parameter variation due to manufacturing imperfections. Process variations severely inhibit …
parameter variation due to manufacturing imperfections. Process variations severely inhibit …
Lifetime reliability improvement of nano-scale digital circuits using dual threshold voltage assignment
M Raji, R Mahmoudi, B Ghavami, S Keshavarzi - IEEE Access, 2021 - ieeexplore.ieee.org
In nano-scale CMOS technology, circuit reliability is a growing concern for complicated
digital circuits due to manufacturing process variation and aging effects. In this paper, a …
digital circuits due to manufacturing process variation and aging effects. In this paper, a …
Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability
T Mohamed, VM van Santen, L Alrahis… - … on Circuits and …, 2024 - ieeexplore.ieee.org
Reliability is one of the key concerns in circuit design. The circuit must be able to tolerate
transistor degradation to sustain reliability against timing failure. Whether a transistor is …
transistor degradation to sustain reliability against timing failure. Whether a transistor is …
Impact of self-heating on performance, power and reliability in finfet technology
Self-heating is one of the biggest threats to reliability in current and advanced CMOS
technologies like FinFET and Nanowire, respectively. Encapsulating the channel with the …
technologies like FinFET and Nanowire, respectively. Encapsulating the channel with the …
Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor
H Amrouch, VM van Santen… - 2024 IEEE …, 2024 - ieeexplore.ieee.org
In ever-shrinking technology nodes, where transistor 3D structures become increasingly
confined and their features verge on the atomic scale, the phenomena of aging and self …
confined and their features verge on the atomic scale, the phenomena of aging and self …
[PDF][PDF] Impact of Negative Capacitance Field-Effect Transistor (NCFET) on Many-Core Systems.
More than a decade ago, the semiconductor technology had entered the so-called nano-
CMOS era, in which the transistor's feature sizes became below 90 nm. Since then, the prior …
CMOS era, in which the transistor's feature sizes became below 90 nm. Since then, the prior …