Review of silicon carbide processing for power MOSFET

C Langpoklakpam, AC Liu, KH Chu, LH Hsu, WC Lee… - Crystals, 2022 - mdpi.com
Owing to the superior properties of silicon carbide (SiC), such as higher breakdown voltage,
higher thermal conductivity, higher operating frequency, higher operating temperature, and …

Overview of real-time lifetime prediction and extension for SiC power converters

Z Ni, X Lyu, OP Yadav, BN Singh… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
Remaining useful lifetime prediction and extension of Si power devices have been studied
extensively. Silicon carbide (SiC) power devices have been developed and commercialized …

高压大容量功率半导体器件技术及其应用

丁荣军, 窦泽春, 罗海辉 - 机车电传动, 2024 - edl.csrzic.com
功率半导体器件作为电气化进程的核心组成部分, 其本身在不断迭代提升, 并促进电气化装置和
应用的发展. 功率半导体器件的关键技术主要体现在4 个方面: 新材料, 新结构, 新封装, 智能化 …

Review on the reliability mechanisms of SiC power MOSFETs: A comparison between planar-gate and trench-gate structures

J Wei, Z Wei, H Fu, J Cao, T Wu, J Sun… - … on Power Electronics, 2023 - ieeexplore.ieee.org
To clarify the current research situation and offer a better understanding of the reliability for
silicon carbide (SiC) power metal-oxide-semiconductor field-effect transistors (mosfet s), a …

Investigation of threshold voltage stability of SiC MOSFETs

D Peters, T Aichinger, T Basler… - 2018 IEEE 30th …, 2018 - ieeexplore.ieee.org
Silicon carbide (SiC) based metal-oxide semiconductor-field-effect-transistors (MOSFETs)
show excellent switching performance and reliability. However, compared to silicon devices …

Impact of terrestrial neutrons on the reliability of SiC VD-MOSFET technologies

C Martinella, RG Alía, R Stark… - … on Nuclear Science, 2021 - ieeexplore.ieee.org
Accelerated terrestrial neutron irradiations were performed on different commercial SiC
power MOSFETs with planar, trench, and double-trench architectures. The results were used …

The current status and trends of 1,200-V commercial silicon-carbide MOSFETs: Deep physical analysis of power transistors from a designer's perspective

AO Adan, D Tanaka, L Burgyan… - IEEE Power Electronics …, 2019 - ieeexplore.ieee.org
There is continuous activity to increase the efficiency and reduce the size of power electronic
systems and modules developed for transportation and automotive electrification …

Investigation and Failure Mode of Asymmetric and Double Trench SiC mosfets Under Avalanche Conditions

X Deng, H Zhu, X Li, X Tong, S Gao… - IEEE transactions on …, 2020 - ieeexplore.ieee.org
In this article, commercially 1200-V asymmetric and double trench silicon carbide (SiC)
metal-oxide-semiconductor-field-effect transistors (mosfets) from two manufacturers are …

Investigation of failure mechanisms of 1200 V rated trench SiC MOSFETs under repetitive avalanche stress

X Deng, W Huang, X Li, X Li, C Chen… - IEEE transactions on …, 2022 - ieeexplore.ieee.org
In this article, the repetitive avalanche ruggedness of silicon carbide metal–oxide–
semiconductor field-effect transistors (MOSFETs) with asymmetric trench (AT) and double …

Comparison of commercial planar and trench SiC MOSFETs by electrical characterization of performance-degrading near-interface traps

M Chaturvedi, S Dimitrijev, D Haasmann… - … on Electron Devices, 2022 - ieeexplore.ieee.org
The suboptimal performance and low channel-carrier mobility of silicon carbide (SiC) power
MOSFETs are attributed to a high density of oxide traps near the 4H-SiC/SiO2 interface. In …