Review of silicon carbide processing for power MOSFET
C Langpoklakpam, AC Liu, KH Chu, LH Hsu, WC Lee… - Crystals, 2022 - mdpi.com
Owing to the superior properties of silicon carbide (SiC), such as higher breakdown voltage,
higher thermal conductivity, higher operating frequency, higher operating temperature, and …
higher thermal conductivity, higher operating frequency, higher operating temperature, and …
Overview of real-time lifetime prediction and extension for SiC power converters
Remaining useful lifetime prediction and extension of Si power devices have been studied
extensively. Silicon carbide (SiC) power devices have been developed and commercialized …
extensively. Silicon carbide (SiC) power devices have been developed and commercialized …
高压大容量功率半导体器件技术及其应用
丁荣军, 窦泽春, 罗海辉 - 机车电传动, 2024 - edl.csrzic.com
功率半导体器件作为电气化进程的核心组成部分, 其本身在不断迭代提升, 并促进电气化装置和
应用的发展. 功率半导体器件的关键技术主要体现在4 个方面: 新材料, 新结构, 新封装, 智能化 …
应用的发展. 功率半导体器件的关键技术主要体现在4 个方面: 新材料, 新结构, 新封装, 智能化 …
Review on the reliability mechanisms of SiC power MOSFETs: A comparison between planar-gate and trench-gate structures
J Wei, Z Wei, H Fu, J Cao, T Wu, J Sun… - … on Power Electronics, 2023 - ieeexplore.ieee.org
To clarify the current research situation and offer a better understanding of the reliability for
silicon carbide (SiC) power metal-oxide-semiconductor field-effect transistors (mosfet s), a …
silicon carbide (SiC) power metal-oxide-semiconductor field-effect transistors (mosfet s), a …
Investigation of threshold voltage stability of SiC MOSFETs
D Peters, T Aichinger, T Basler… - 2018 IEEE 30th …, 2018 - ieeexplore.ieee.org
Silicon carbide (SiC) based metal-oxide semiconductor-field-effect-transistors (MOSFETs)
show excellent switching performance and reliability. However, compared to silicon devices …
show excellent switching performance and reliability. However, compared to silicon devices …
Impact of terrestrial neutrons on the reliability of SiC VD-MOSFET technologies
C Martinella, RG Alía, R Stark… - … on Nuclear Science, 2021 - ieeexplore.ieee.org
Accelerated terrestrial neutron irradiations were performed on different commercial SiC
power MOSFETs with planar, trench, and double-trench architectures. The results were used …
power MOSFETs with planar, trench, and double-trench architectures. The results were used …
The current status and trends of 1,200-V commercial silicon-carbide MOSFETs: Deep physical analysis of power transistors from a designer's perspective
AO Adan, D Tanaka, L Burgyan… - IEEE Power Electronics …, 2019 - ieeexplore.ieee.org
There is continuous activity to increase the efficiency and reduce the size of power electronic
systems and modules developed for transportation and automotive electrification …
systems and modules developed for transportation and automotive electrification …
Investigation and Failure Mode of Asymmetric and Double Trench SiC mosfets Under Avalanche Conditions
X Deng, H Zhu, X Li, X Tong, S Gao… - IEEE transactions on …, 2020 - ieeexplore.ieee.org
In this article, commercially 1200-V asymmetric and double trench silicon carbide (SiC)
metal-oxide-semiconductor-field-effect transistors (mosfets) from two manufacturers are …
metal-oxide-semiconductor-field-effect transistors (mosfets) from two manufacturers are …
Investigation of failure mechanisms of 1200 V rated trench SiC MOSFETs under repetitive avalanche stress
X Deng, W Huang, X Li, X Li, C Chen… - IEEE transactions on …, 2022 - ieeexplore.ieee.org
In this article, the repetitive avalanche ruggedness of silicon carbide metal–oxide–
semiconductor field-effect transistors (MOSFETs) with asymmetric trench (AT) and double …
semiconductor field-effect transistors (MOSFETs) with asymmetric trench (AT) and double …
Comparison of commercial planar and trench SiC MOSFETs by electrical characterization of performance-degrading near-interface traps
The suboptimal performance and low channel-carrier mobility of silicon carbide (SiC) power
MOSFETs are attributed to a high density of oxide traps near the 4H-SiC/SiO2 interface. In …
MOSFETs are attributed to a high density of oxide traps near the 4H-SiC/SiO2 interface. In …