Optical characterization of polycrystalline ZnSe1− xTex thin films using variable angle spectroscopic ellipsometry and spectrophotmetery techniques

ER Shaaban, M El-Hagary, M Emam-Ismail… - Materials Science in …, 2015 - Elsevier
Abstract Polycrystalline ZnSe 1− x Te x (0.0≤ x≤ 1.0) thin films were deposited by the
electron beam deposition technique on corning glass substrate. Two different techniques …

[HTML][HTML] Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic …

JB Renkó, A Romanenko, PJ Szabó, A Sulyok… - Journal of Materials …, 2022 - Elsevier
The structural and chemical homogeneity of the developed thin film upon color etching a low-
carbon steel specimen with Beraha-I type color etchant was investigated by spectroscopic …

Quality control of slot-die coated aluminum oxide layers for battery applications using hyperspectral imaging

F Gruber, P Wollmann, B Schumm, W Grählert… - Journal of …, 2016 - mdpi.com
Hyperspectral inspection using imaging systems is becoming more and more important for
quality control tasks in several industries, replacing well trained operators or established …

Thickness dependence of structural and optical properties of cadmium iodide thin films

IS Yahia, M Shapaan, YAM Ismail, AM Aboraia… - Journal of Alloys and …, 2015 - Elsevier
Structural and optical properties as a function of film thickness have been studied for the
thermally evaporated cadmium iodide (CdI 2) films. According to XRD structure, the …

Investigating the kinetics of layer development during the color etching of low-carbon steel with in-situ spectroscopic ellipsometry

JB Renkó, A Romanenko, T Bíró, PJ Szabó, P Petrik… - Heliyon, 2024 - cell.com
Color etching is a useful corrosive process, widely applied in metallography to study the
microstructure of metals. To prove the existence of the previously hypothesized steady-state …

Investigation of ellipsometric parameters of 2D microrough surfaces by FDTD

J Qiu, DF Ran, YB Liu, LH Liu - Applied Optics, 2016 - opg.optica.org
Ellipsometry is a powerful method for measuring the optical constants of materials and is
very sensitive to surface roughness. In previous ellipsometric measurement of optical …

[PDF][PDF] 用于光学放大的掺铒氧化铝脊型波导研究

邬健, 杨振, 魏腾秀, 张政, 王威, 刘瑞雪… - APPLIED …, 2023 - researching.cn
摘要使用磁控溅射制备了掺铒氧化铝薄膜, 对薄膜进行了退火处理, 测量薄膜的折射率和X
射线衍射图谱, 发现薄膜在600℃ 的退火温度下呈非晶态, 在1.5 μm 处的折射率为1.67 左右 …

[PDF][PDF] JÓZSEF BÁLINT RENKÓ

PJ SZABÓ - 2023 - repozitorium.omikk.bme.hu
Nowadays, etching is a popular method in the industry, as it offers a relatively fast and easy
solution to dissolve small amounts of material with high precision. During a typical process …

Investigation of Microstructure, Orientation, and Layer Development During Color Etching

JB Renkó - 2023 - search.proquest.com
Color etching, an etchant variation that develops a layer over the surface instead of only
removing material, is particularly sensitive to grain orientation. Compared to other methods …

[PDF][PDF] Színesen mart ferrites acél vizsgálata spektroszkópiai ellipszometriával

JB Renkó, A Romanenko, PJ Szabó, P Petrik… - … és Kohászati Lapok …, 2021 - real.mtak.hu
Szabó Péter János 1992-ben szerzett villamosmérnöki oklevelet a Budapesti Műszaki
Egyetemen, majd 1995-ben PhD-fokozatot nagyfelbontású röntgen vonalprofil-analízis …