HfO2-based ferroelectrics: From enhancing performance, material design, to applications

H Chen, X Zhou, L Tang, Y Chen, H Luo… - Applied Physics …, 2022 - pubs.aip.org
Nonvolatile memories are in strong demand due to the desire for miniaturization, high-speed
storage, and low energy consumption to fulfill the rapid developments of big data, the …

Review of defect chemistry in fluorite-structure ferroelectrics for future electronic devices

MH Park, DH Lee, K Yang, JY Park, GT Yu… - Journal of Materials …, 2020 - pubs.rsc.org
Ferroelectricity in fluorite-structure oxides, such as (doped) HfO2 and ZrO2, and their solid
solution, nanolaminates, and superlattices has attracted increasing interest for future …

The influence of top and bottom metal electrodes on ferroelectricity of hafnia

Y Lee, Y Goh, J Hwang, D Das… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
In recent years, several experimental approaches have been adopted to study and
understand the mechanism and improve the ferroelectricity of fluorite-type hafnia-based …

Ultra-thin Hf0. 5Zr0. 5O2 thin-film-based ferroelectric tunnel junction via stress induced crystallization

Y Goh, J Hwang, Y Lee, M Kim, S Jeon - Applied Physics Letters, 2020 - pubs.aip.org
We report on 4.5-nm-thick Hf 0.5 Zr 0.5 O 2 (HZO) thin-film-based ferroelectric tunnel
junctions (FTJs) with a tungsten (W) bottom electrode. The HZO on the W electrode exhibits …

A review on morphotropic phase boundary in fluorite-structure hafnia towards DRAM technology

M Jung, V Gaddam, S Jeon - Nano Convergence, 2022 - Springer
In the present hyper-scaling era, memory technology is advancing owing to the demand for
high-performance computing and storage devices. As a result, continuous work on …

Insertion of HfO2 Seed/Dielectric Layer to the Ferroelectric HZO Films for Heightened Remanent Polarization in MFM Capacitors

V Gaddam, D Das, S Jeon - IEEE Transactions on Electron …, 2020 - ieeexplore.ieee.org
This article highlights the role of HfO 2 seed/dielectric insertion layers on the ferroelectric
properties of hafnium zirconium oxide (HZO)-based metal-ferroelectric-metal (MFM) …

Physics, Structures, and Applications of Fluorite‐Structured Ferroelectric Tunnel Junctions

J Hwang, Y Goh, S Jeon - Small, 2024 - Wiley Online Library
The interest in ferroelectric tunnel junctions (FTJ) has been revitalized by the discovery of
ferroelectricity in fluorite‐structured oxides such as HfO2 and ZrO2. In terms of thickness …

Novel Approach to High κ (∼59) and Low EOT (∼3.8 Å) near the Morphotrophic Phase Boundary with AFE/FE (ZrO2/HZO) Bilayer Heterostructures and High …

V Gaddam, G Kim, T Kim, M Jung, C Kim… - ACS Applied Materials …, 2022 - ACS Publications
We present herewith a novel approach of equally thick AFE/FE (ZrO2/HZO) bilayer stack
heterostructure films for achieving an equivalent oxide thickness (EOT) of 4.1 Å with a …

Excellent Reliability and High-Speed Antiferroelectric HfZrO2 Tunnel Junction by a High-Pressure Annealing Process and Built-In Bias Engineering

Y Goh, J Hwang, S Jeon - ACS Applied Materials & Interfaces, 2020 - ACS Publications
Hafnia-based ferroelectric tunnel junctions (FTJs) have great potential for use in logic in
nonvolatile memory because of their complementary metal–oxide–semiconductor process …

Ferroelectricity Enhancement in Hf0.5Zr0.5O2 Based Tri-Layer Capacitors at Low-Temperature (350 °C) Annealing Process

V Gaddam, D Das, T Jung… - IEEE Electron Device …, 2021 - ieeexplore.ieee.org
The use of additional dielectric (DE) layers such as Al 2 O 3, ZrO 2, HfO 2 and Ta 2 O 5 with
Hf 0.5 Zr 0.5 O 2 (HZO) ferroelectric (FE) layer, namely bi-layer systems are drawing much …