Power integrity analysis of a 28 nm dual-core arm cortex-a57 cluster using an all-digital power delivery monitor
PN Whatmough, S Das… - IEEE Journal of Solid …, 2017 - ieeexplore.ieee.org
This paper presents a power delivery monitor (PDM) peripheral integrated in a flip-chip
packaged 28 nm system-on-chip (SoC) for mobile computing. The PDM is composed …
packaged 28 nm system-on-chip (SoC) for mobile computing. The PDM is composed …
Generation of stressmarks for early stage soft-error modeling
K Swaminathan, R Bertran, H Jacobson… - 2019 49th Annual …, 2019 - ieeexplore.ieee.org
Early-stage Soft-Error Rate (SER) vulnerability modeling and estimation is essential for all
types of processing platforms, ranging from embedded/IoT processors to server-class …
types of processing platforms, ranging from embedded/IoT processors to server-class …
Processor stressmarks generation
R Bertran, P Bose, A Buyuktosunoglu - US Patent 9,575,867, 2017 - Google Patents
One aspect is a method that includes analyzing, by a processor of an analysis system, an
instruction set architecture of a targeted processor to generate an instruction set profile for …
instruction set architecture of a targeted processor to generate an instruction set profile for …
Computer system performance analyzer
R Bertran, P Bose, A Buyuktosunoglu… - US Patent …, 2020 - Google Patents
One aspect is an analysis system that includes a processor operably coupled to a memory
and configured to perform a method. The method includes defining a set of workloads for a …
and configured to perform a method. The method includes defining a set of workloads for a …