The atomic force microscope (AFM) is not only a tool to image the topography of solid
surfaces at high resolution. It can also be used to measure force-versus-distance curves …

Ferroelectrics and multiferroics have recently emerged as perspective materials for
information technology and data storage applications. The combination of extremely narrow …

The dielectric constant ε of interfacial water has been predicted to be smaller than that of
bulk water (ε≈ 80) because the rotational freedom of water dipoles is expected to decrease …

The structure of water at the interface with other materials is thought to determine their
wetting properties and underlies the vast array of phenomena known under the names of …

A simple optical method is presented for identifying and measuring the effective optical
properties of nanometer-thick, graphene-based materials, based on the use of substrates …

Significant progress has been made both in experimentation and in theoretical modeling of
scanning probe microscopy. The theoretical models used to analyze and interpret …

Scattering-type scanning near-field microscopy (s-SNOM) at terahertz (THz) frequencies
could become a highly valuable tool for studying a variety of phenomena of both …

We present a procedure for calibrated complex impedance measurements and dielectric
quantification with scanning microwave microscopy. The calibration procedure works in situ …

Fundamental mechanisms of energy storage, corrosion, sensing, and multiple biological
functionalities are directly coupled to electrical processes and ionic dynamics at solid–liquid …

Label-free detection of the material composition of nanoparticles could be enabled by the
quantification of the nanoparticles' inherent dielectric response to an applied electric field …