Stochastic testing method for transistor-level uncertainty quantification based on generalized polynomial chaos

Z Zhang, TA El-Moselhy, IM Elfadel… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
Uncertainties have become a major concern in integrated circuit design. In order to avoid the
huge number of repeated simulations in conventional Monte Carlo flows, this paper presents …

Enabling high-dimensional hierarchical uncertainty quantification by ANOVA and tensor-train decomposition

Z Zhang, X Yang, IV Oseledets… - … on Computer-Aided …, 2014 - ieeexplore.ieee.org
Hierarchical uncertainty quantification can reduce the computational cost of stochastic circuit
simulation by employing spectral methods at different levels. This paper presents an efficient …

Uncertainty quantification of silicon photonic devices with correlated and non-Gaussian random parameters

TW Weng, Z Zhang, Z Su, Y Marzouk, A Melloni… - Optics express, 2015 - opg.optica.org
Process variations can significantly degrade device performance and chip yield in silicon
photonics. In order to reduce the design and production costs, it is highly desirable to predict …

Calculation of generalized polynomial-chaos basis functions and Gauss quadrature rules in hierarchical uncertainty quantification

Z Zhang, TA El-Moselhy, IM Elfadel… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
Stochastic spectral methods are efficient techniques for uncertainty quantification. Recently
they have shown excellent performance in the statistical analysis of integrated circuits. In …

Accelerated probabilistic power flow in electrical distribution networks via model order reduction and Neumann series expansion

S Chevalier, L Schenato… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
This paper develops a computationally efficient algorithm which speeds up the probabilistic
power flow (PPF) problem by exploiting the inherently low-rank nature of the voltage profile …

Stochastic testing simulator for integrated circuits and MEMS: Hierarchical and sparse techniques

Z Zhang, X Yang, G Marucci… - Proceedings of the …, 2014 - ieeexplore.ieee.org
Process variations are a major concern in today's chip design since they can significantly
degrade chip performance. To predict such degradation, existing circuit and MEMS …

Scattering from two-dimensional objects of varying shape combining the method of moments with the stochastic Galerkin method

Z Zubac, D De Zutter, DV Ginste - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
In this communication, the combined field integral equation for perfect electrically conducting
scatterers is combined with the stochastic Galerkin method (SGM) to model the impact of …

Scattering from two-dimensional objects of varying shape combining the multilevel fast multipole method (MLFMM) with the stochastic Galerkin method (SGM)

Z Zubac, D De Zutter, DV Ginste - IEEE Antennas and Wireless …, 2014 - ieeexplore.ieee.org
In this letter, the Multilevel Fast Multipole Method (MLFMM) is combined with the polynomial
chaos expansion (PCE) approach to model the stochastic variations of a scatterer. In …

High-accuracy parasitic extraction

M Kamon, R Iverson - EDA for IC implementation, circuit design …, 2018 - taylorfrancis.com
In this chapter, we describe high-accuracy parasitic extraction by both fast integral equation
methods as well as random-walk-based methods. For any extraction application, the …

[图书][B] Variational formulations and functional approximation algorithms in stochastic plasticity of materials

B Rosić - 2013 - search.proquest.com
A class of abstract stochastic variational inequalities of the second kind described by
uncertain parameters is considered within the framework of infinitesimal and large …