CMOS Scaling for the 5 nm Node and Beyond: Device, Process and Technology

HH Radamson, Y Miao, Z Zhou, Z Wu, Z Kong, J Gao… - Nanomaterials, 2024 - mdpi.com
After more than five decades, Moore's Law for transistors is approaching the end of the
international technology roadmap of semiconductors (ITRS). The fate of complementary …

A benchmark of germane and digermane for the low temperature growth of intrinsic and heavily in-situ boron-doped SiGe

JM Hartmann, J Aubin, JP Barnes - ECS Transactions, 2016 - iopscience.iop.org
We have benchmarked germane and digermane for the low temperature growth of intrinsic
and heavily in-situ borondoped SiGe (with disilane as the Si gaseous precursor). At 500 C …

Characteristics of high-order silane based Si and SiGe epitaxial growth under 600℃

D Yoon, H Shin, S Oh, C Jo, K Lee, S Jung… - Journal of Crystal …, 2024 - Elsevier
Abstract Low temperature Si and SiGe epitaxy have been crucial in the semiconductor
industry, prompting interest in high-order silanes as Si precursors. In this study, we …

Low temperature RPCVD epitaxial growth of Si1− xGex using Si2H6 and Ge2H6

S Wirths, D Buca, AT Tiedemann, P Bernardy… - Solid-state …, 2013 - Elsevier
The growth of intrinsic SiGe and, n-and p-type doping of Si and SiGe layers was studied
using a Reduced Pressure Chemical Vapor Deposition AIXTRON TRICENT® cluster tool …

Ultralow temperature epitaxial growth of silicon-germanium thin films on Si (001) using GeF4

K Tao, J Wang, R Jia, Y Sun, Z Jin, X Liu - Diamond and Related Materials, 2016 - Elsevier
By designing oxidation-reduction reaction, epitaxial growth of silicon-germanium (Si 1− x Ge
x: 0≤ x≤ 1) films on Si (001) at low temperature has been achieved using reactive thermal …

Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects

S Ike, E Simoen, Y Shimura, A Hikavyy… - Japanese Journal of …, 2016 - iopscience.iop.org
We have investigated the structural and electrical properties of n-type doped Si 1− x Ge x
epitaxial layers (x= 24–26%) grown by chemical vapor deposition with conventional [SiH 2 …

Etude du procédé de CVD en lit fluidisé en vue de revêtir des particules denses pour applications nucléaires

F Vanni - 2015 - theses.hal.science
Cette thèse s' inscrit dans le cadre du développement d'un combustible nucléaire faiblement
enrichi pour les réacteurs de recherche, constitué de particules d'uranium-molybdène …

Sensitivity of signal-to-noise ratio to the layer profile and crystal quality of SiGe/Si multilayers

HH Radamson, M Moeen, A Abedin… - ECS Journal of Solid …, 2016 - iopscience.iop.org
This study presents signal-to-noise ratio (SNR) measurements of single crystalline dots or
layers of SiGe/Si in multilayer structures in terms of Ge content, interfacial and layer quality …

Fabrication of Group IV Semiconductors on Insulator for Monolithic 3D Integration

A Asadollahi - 2018 - diva-portal.org
The conventional 2D geometrical scaling of transistors is now facing many challenges in
order to continue the performance enhancement while decreasing power consumption. The …

[PDF][PDF] En vue de l'obtention du

RDSURLEB MEDITERRANEEN, CDUP CHARMEX - core.ac.uk
Modélisation des aérosols marins et de leur impact radiatif direct sur le bassin méditerranéen
dans le cadre du projet CHARM Page 1 En vue de l'obtention du DOCTORAT DE …