A Visionary Look at the Security of Reconfigurable Cloud Computing

M Stojilović, K Rasmussen, F Regazzoni… - Proceedings of the …, 2023 - ieeexplore.ieee.org
Field-programmable gate arrays (FPGAs) have become critical components in many cloud
computing platforms. These devices possess the fine-grained parallelism and specialization …

Method and apparatus to use physical design information to detect IR drop prone test patterns

SA Thirunavukarasu, S Bhabu… - US Patent …, 2011 - Google Patents
2. Description of the Related Art As integrated circuits have become more complex and
densely packed with gates, they have become progressively more difficult to test in order to …

Design of a reliable power delivery network for monolithic 3D ICs

SC Hung, K Chakrabarty - 2020 Design, Automation & Test in …, 2020 - ieeexplore.ieee.org
As Moore's law hits physical limits, monolithic 3D (M3D) integration based on fine-grained
monolithic inter-tier vias is emerging as a promising technique to continue performance …

Characterization of the worst-case current waveform excitations in general RLC-model power grid analysis

N Evmorfopoulos, MA Rammou… - 2010 IEEE/ACM …, 2010 - ieeexplore.ieee.org
Validating the robustness of power distribution in modern IC design is a crucial but very
difficult problem, due to the vast number of possible working modes and the high operating …

A power grid analysis and verification tool based on a Statistical Prediction Engine

MK Tsiampas, D Bountas, P Merakos… - 2010 17th IEEE …, 2010 - ieeexplore.ieee.org
Voltage drops are one of the most stringent problems in modern IC implementation, which is
exacerbated by the ever decreasing transistor sizes and interconnect line widths. In order to …

Method and apparatus to use physical design information to detect IR drop prone test patterns

SA Thirunavukarasu, S Bhabu… - US Patent …, 2012 - Google Patents
A method is provided to evaluate whether one or more test patterns is power safe for use
during manufacturing testing of an integrated circuit that includes a nonuniform power grid …

Method and apparatus to use physical design information to detect IR drop prone test patterns

SA Thirunavukarasu, S Bhabu… - US Patent …, 2013 - Google Patents
(51) Int. Cl. mining whether respective numbers of toggles by Scan ele G06F 17/50(2006.01)
ments of the scan chain within one or more respective power (52) US Cl. grid regions meet …

A macromodel technique for VLSI dynamic simulation by mapping pre-characterized transitions

D Bountas, G Stamoulis… - 2008 IEEE International …, 2008 - ieeexplore.ieee.org
Accurate simulation of digital circuits is an essential part of the design process. High
precision models are generally used to confirm logic behavior and estimate power …

Method and apparatus to use physical design information to detect IR drop prone test patterns

SA Thirunavukarasu, S Bhabu… - US Patent …, 2013 - Google Patents
2. Description of the Related Art As integrated circuits have become more complex and
densely packed with gates, they have, become progressively more difficult to test in order to …

Fast power delivery network analyzer

B Hwang, J Koo, C Hwang, Y Cheon… - … on Quality Electronic …, 2011 - ieeexplore.ieee.org
With the increase in circuit frequency and supply voltage Scaling, a robust power network
design is essential to ensure that the circuits on a chip operate reliably at the guaranteed …