Soft error reliability evaluation of nanoscale logic circuits in the presence of multiple transient faults
S Cai, B He, W Wang, P Liu, F Yu, L Yin, B Li… - Journal of Electronic …, 2020 - Springer
Radiation-induced single transient faults (STFs) are expected to evolve into multiple
transient faults (MTFs) at nanoscale CMOS technology nodes. For this reason, the reliability …
transient faults (MTFs) at nanoscale CMOS technology nodes. For this reason, the reliability …
A novel trust evaluation method for logic circuits in IoT applications based on the E-PTM model
The increase in the reliability requirements of integrated circuits applied in diverse smart
sensing devices and the increase in the cost of test generation and fault simulation have …
sensing devices and the increase in the cost of test generation and fault simulation have …
Improved multiple faults-aware placement strategy: Reducing the overheads and error rates in digital circuits
State-of-the-art commercial placement tools have as goals to optimize area, timing, and
power. Over the years, several reliability oriented placement strategies have been proposed …
power. Over the years, several reliability oriented placement strategies have been proposed …
A novel gate grading approach for soft error tolerance in combinational circuits
Continuous reduction in the minimum feature size of semiconductor devices and the supply
voltages in advanced VLSI logic circuits has made those circuits more susceptible to soft …
voltages in advanced VLSI logic circuits has made those circuits more susceptible to soft …
[引用][C] Avaliação de confiabilidade considerando falhas transientes do tipo Single Event Transient
[引用][C] A weighted averaging method for signal probabilityof logic circuit combined with reconvergent fan-out structures () Share
X Jie, M Weifeng, W Lee, S Zhanhui