SiC and GaN devices–wide bandgap is not all the same

N Kaminski, O Hilt - IET Circuits, Devices & Systems, 2014 - Wiley Online Library
Silicon carbide (SiC)‐diodes have been commercially available since 2001 and various SiC‐
switches have been launched recently. Parallelly, gallium nitride (GaN) is moving into power …

SiC power devices—Present status, applications and future perspective

M Östling, R Ghandi… - 2011 IEEE 23rd …, 2011 - ieeexplore.ieee.org
Silicon carbide (SiC) semiconductor devices for high power applications are now
commercially available as discrete devices. Recently Schottky diodes are offered by both …

A survey of wide bandgap power semiconductor devices

J Millan, P Godignon, X Perpiñà… - IEEE transactions on …, 2013 - ieeexplore.ieee.org
Wide bandgap semiconductors show superior material properties enabling potential power
device operation at higher temperatures, voltages, and switching speeds than current Si …

Vertical power pn diodes based on bulk GaN

IC Kizilyalli, AP Edwards, O Aktas… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
There is a great interest in wide-bandgap semiconductor devices and most recently in
monolithic GaN structures for power electronics applications. In this paper, vertical pn diodes …

1.5-kV and 2.2-m -cm Vertical GaN Transistors on Bulk-GaN Substrates

H Nie, Q Diduck, B Alvarez, AP Edwards… - IEEE Electron …, 2014 - ieeexplore.ieee.org
In this letter, vertical GaN transistors fabricated on bulk GaN substrates are discussed. A
threshold voltage of 0.5 V and saturation current> 2.3 A are demonstrated. The measured …

GaN power transistors on Si substrates for switching applications

N Ikeda, Y Niiyama, H Kambayashi… - Proceedings of the …, 2010 - ieeexplore.ieee.org
In this paper, GaN power transistors on Si substrates for power switching application are
reported. GaN heterojunction field-effect transistor (HFET) structure on Si is an important …

Lateral 1.8 kV -Ga2O3 MOSFET With 155 MW/cm2 Power Figure of Merit

K Tetzner, EB Treidel, O Hilt, A Popp… - IEEE Electron …, 2019 - ieeexplore.ieee.org
-Lateral β-Ga 2 O 3 MOSFET for power switching applications with a 1.8 kV breakdown
voltage and a record power figure of merit of 155 MW/cm 2 are demonstrated. Sub-μm gate …

A current-transient methodology for trap analysis for GaN high electron mobility transistors

J Joh, JA Del Alamo - IEEE Transactions on Electron Devices, 2010 - ieeexplore.ieee.org
Trapping is one of the most deleterious effects that limit performance and reliability in GaN
HEMTs. In this paper, we present a methodology to study trapping characteristics in GaN …

High voltage vertical GaN pn diodes with avalanche capability

IC Kizilyalli, AP Edwards, H Nie… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
In this paper, vertical pn diodes fabricated on pseudobulk gallium nitride (GaN) substrates
are discussed. The measured devices demonstrate breakdown voltages of 2600 V with a …

AlGaN/GaN/GaN:C Back-Barrier HFETs With Breakdown Voltage of Over 1 kV and Low

E Bahat-Treidel, F Brunner, O Hilt, E Cho… - … on Electron Devices, 2010 - ieeexplore.ieee.org
A systematic study of GaN-based heterostructure field-effect transistors with an insulating
carbon-doped GaN back barrier for high-voltage operation is presented. The impact of …