Control of the Orientation of Symmetric Poly(styrene)-block-poly(d,l-lactide) Block Copolymers Using Statistical Copolymers of Dissimilar Composition

I Keen, A Yu, HH Cheng, KS Jack, TM Nicholson… - Langmuir, 2012 - ACS Publications
The interactions of block copolymers with surfaces can be controlled by coating those
surfaces with appropriate statistical copolymers. Usually, a statistical copolymer comprised …

Parallel arrays of sub-10 nm aligned germanium nanofins from an in situ metal oxide hardmask using directed self-assembly of block copolymers

C Cummins, A Gangnaik, RA Kelly, AJ Hydes… - Chemistry of …, 2015 - ACS Publications
High-mobility materials and non-traditional device architectures are of key interest in the
semiconductor industry because of the need to achieve higher computing speed and low …

Nano-confinement of block copolymers in high accuracy topographical guiding patterns: Modelling the emergence of defectivity due to incommensurability

S Gottlieb, D Kazazis, I Mochi, L Evangelio… - Soft Matter, 2018 - pubs.rsc.org
Extreme ultraviolet interference lithography (EUV-IL) is used to manufacture topographical
guiding patterns to direct the self-assembly of block copolymers. High-accuracy silicon oxide …

Selective etching of polylactic acid in poly(styrene)‐block‐poly(d,l)lactide diblock copolymer for nanoscale patterning

C Cummins, P Mokarian‐Tabari… - Journal of Applied …, 2014 - Wiley Online Library
Self‐assembled thin films of a lamellar forming polystyrene‐block‐poly (d, l) lactide (PS‐b‐
PLA) block copolymer (BCP) contain a “reactive” block that can be readily removed to …

Self-assembly of block copolymers by graphoepitaxy

SM Nicaise, KGA Tavakkoli, KK Berggren - … of Block Co-polymers for Nano …, 2015 - Elsevier
In the fabrication of a desired block copolymer (BCP) nanostructure for a particular
application, a key challenge is the control of the BCP microdomain assembly. Graphoepitaxy …

Healing LER using directed self assembly: treatment of EUVL resists with aqueous solutions of block copolymers

YM Chuang, HH Cheng, K Jack… - Alternative …, 2013 - spiedigitallibrary.org
Overcoming the resolution-LER-sensitivity trade-off is a key challenge for the development
of novel resists and processes that are able to achieve the ITRS targets for future lithography …

Polyelectrolyte multilayer-like films from layer-by-layer processing of protected polyampholytic block copolymers

JK Park, J Zhang, R Roy, S Ge… - Chemical Communications, 2018 - pubs.rsc.org
Polyelectrolyte multilayer films (PEMs) are conventionally prepared by a layer-by-layer (LbL)
deposition of alternating polycation and polyanion solutions. We introduce herein a block …

Improvement in electron-beam lithography throughput by exploiting relaxed patterning fidelity requirements with directed self-assembly

HY Yu, CH Liu, YT Shen, HP Lee… - Alternative Lithographic …, 2014 - spiedigitallibrary.org
Line edge roughness (LER) influencing the electrical performance of circuit components is a
key challenge for electronbeam lithography (EBL) due to the continuous scaling of …

PMMA removal selectivity to PS using dry etch approach for sub-10nm node applications

A Sarrazin, P Pimenta-Barros… - 2015 China …, 2015 - ieeexplore.ieee.org
Directed Self-Assembly (DSA) of Block Copolymers (BCP) is one of the most promising
alternative lithography techniques for sub-10 nm nodes. In this paper, we propose to study …

Lithographically produced features

I Blakey, Y Chuang, AK Whittaker, KS Jack - US Patent 9,606,440, 2017 - Google Patents
The present invention relates to a method for modifying line edge roughness on a
lithographically-produced feature in a material, the method comprising applying a block …