Breaking current balance enhancement for parallel IGBT modules in DC circuit breaker

W Wen, H Jin, B Li, P Li, H Liu… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Limited by the turn-off ability of single power module, parallel connection of insulated-gate
bipolar transistors (IGBTs) is essential to enable breaking ability of current in the order of …

Current measurement method of multiple chips using rectangular PCB Rogowski coils integrated in press pack IGBT device

S Fu, X Li, Z Lin, Z Zhao, X Cui… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Unbalance of transient currents of multiple chips inside press-pack insulated-gate bipolar
transistor (PP IGBT) results in degrading operation and even device damage. Chip currents …

Comparisons of two turn-off failures under clamped inductive load in planar FS 3.3 kV/50 A IGBT chip

J Fan, Y Wang, F He, M Gao, Z Zhao… - … on Power Electronics, 2022 - ieeexplore.ieee.org
Turn-off failure under clamped inductive load, is one of the most concerns in insulated gate
bipolar transistor (IGBT) chips. Besides, this turn-off failure can be attributed to two causes …

Variable amplitude gate voltage synchronous drive technique for improving dynamic current balancing in paralleled IGBTs

J Zhang, E Lei, L Jin, K Ma, Y Li, X Li, C Xia, X Wang - Energies, 2023 - mdpi.com
The problem of current sharing imbalance in the parallel connection of IGBT multi-modules
affects the wide-scale application of parallel IGBT. The current imbalance problem in the …

A Segmented Rogowski Coils based Non-Invasive Monitoring Method of Current Imbalance in Press Pack IGBTs

Y Lu, X Zhang, H Shen, W Zhang… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Press pack insulated-gate bipolar transistor (PP IGBT) plays an essential role in high-
capacity power electronic transmission equipment. Due to the influence of various factors …

压接型IGBT 芯片的参数分散性对其并联时关断均流的影响

曹子楷, 崔翔, 代安琪, 李学宝, 范迦羽… - 中国电机工程 …, 2023 - epjournal.csee.org.cn
压接型绝缘栅双极晶体管(insulated gate bipolar transistor, IGBT) 的多芯片并联关断期间会
出现严重的不均流现象, 直接影响到器件的关断可靠性. 文中重点研究压接型IGBT …

Investigation on Saturation Voltage Increment of Multichip Press-Pack IGBTs Under Power Cycling Tests

C Zhan, L Zhu, Y Zhang, S Ji… - IEEE Transactions …, 2024 - ieeexplore.ieee.org
In this article, the increment mechanism of the saturation voltage of multichip press-pack
insulated gate bipolar transistors (IGBTs) during power cycling tests (PCTs) is investigated …

An Improved Evaluation Method for the Short-Circuit Withstand Capability of Press-Pack IGBT Modules

R Liu, H Li, R Yao, S Chen, X Luo, W Lai… - … on Electron Devices, 2023 - ieeexplore.ieee.org
The short-circuit withstand capability (SCWC) of the press-pack insulated gate bipolar
transistor (IGBT) module (PP-IGBT) was investigated, and its evaluation method was …

Impacts of the Pressure Distribution on Dynamic Avalanche in Single Press-Pack IGBT Chip

T Li, Y Wang, Y Zhang, J Fan, X Li… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
Within a press-pack insulated gate bipolar transistor (PP IGBT) submodule, the components
are packaged by external clamping force. This external clamping force significantly affects …

PCB Rogowski Coil Array with Discrete Electrostatic Shielding for Current Measurement of Paralleled Chips in Power Devices

Y Zhan, G Feng, J Wan, X Li, R Jin… - … on Power Electronics, 2024 - ieeexplore.ieee.org
Printed Circuit Board (PCB) Rogowski coil array is capable of measuring the currents of the
paralleled chips inside power devices, the operating status and failure behaviour of power …