Traditionally, work on analog testing has focused on diagnosing faults in board designs.
Recently, with increasing levels of integration, not just diagnosing faults, but distinguishing …

Increasing levels of integration and high speeds of operation have made the problem of
testing complex systems-on-packages (SOPs) very difficult. Testing packages with …

This paper describes a simple test generation technique which derives sinusoidal test
waveforms that detect several fault classes. In addition, the authors show that certain stimuli …

Virtually all theoretical work on message routing in parallel computers has dwelt on packet
routing: messages are conveyed as packets, an entire packet can reside at a node of the …

Escalating demand for mixed-signal Integrated Circuits has been accompanied by the need
to develop efficient strategies to guarantee higher quality at lower cost. One key to achieving …

In this paper we discuss the capabilities of the MiST PROFIT (Mixed Signal Test Program for
Fault Insertion and Testing) software for hierarchical fault modeling, tolerance modeling …

Integrating design and test presents a good challenge in today's analog circuit
manufacturing process. Designs should be made according to the sensitivity of the output to …

Inductive Fault Analysis (IFA) for analog circuits has received considerable attention in
recent years. IFA can be exploited for simplifying various aspects of analog testing. It can …

Supply current test is well established for digital CMOS circuits and the advantages of
improved observability and reliability indication have prompted its use for analogue and …

In this work we present a behavioral fault simulation technique for mixed-signal ICs, wherein
a robust function approximation method namely regression splines are applied to …