Synaptic emulation via ferroelectric P (VDF-TrFE) reinforced charge trapping/detrapping in Zinc–Tin oxide transistor

CK Shen, R Chaurasiya, KT Chen… - ACS Applied Materials & …, 2022 - ACS Publications
Brain inspired artificial synapses are highly desirable for neuromorphic computing and are
an alternative to a conventional computing system. Here, we report a simple and cost …

Hydrogen Bistability as the Origin of Photo‐Bias‐Thermal Instabilities in Amorphous Oxide Semiconductors

Y Kang, BD Ahn, JH Song, YG Mo… - Advanced Electronic …, 2015 - Wiley Online Library
Zinc‐based metal oxide semiconductors have attracted attention as an alternative to current
silicon‐based semiconductors for applications in transparent and flexible electronics …

Defect reduction in photon-accelerated negative bias instability of InGaZnO thin-film transistors by high-pressure water vapor annealing

Y Seung Rim, W Jeong, B Du Ahn… - Applied Physics Letters, 2013 - pubs.aip.org
We investigated the effects of high-pressure water vapor annealing (WHPA) under negative
bias temperature illumination stress and light incidence on amorphous InGaZnO thin-film …

Photo stability of solution-processed low-voltage high mobility zinc-tin-oxide/ZrO2 thin-film transistors for transparent display applications

TJ Ha, A Dodabalapur - Applied Physics Letters, 2013 - pubs.aip.org
We report solution-processed low-voltage zinc-tin-oxide (ZTO)/zirconium-oxide thin-film
transistors (TFTs) possessing a field-effect mobility of∼ 10 cm 2/Vs, a threshold voltage of …

Mobility enhancement in RF-sputtered MgZnO/ZnO heterostructure thin-film transistors

BS Wang, YS Li, IC Cheng - IEEE Transactions on Electron …, 2016 - ieeexplore.ieee.org
Coplanar top-gate MgZnO/ZnO heterostructure thin-film transistors (TFTs) are fabricated on
glass substrates using a large-area processing compatible RF-sputtering technique. The …

Indium gallium oxide thin film transistor for two-stage UV sensor application

WL Huang, MH Hsu, SP Chang… - ECS Journal of Solid …, 2019 - iopscience.iop.org
In this work, indium gallium oxide (IGO) thin film transistor (TFT) was fabricated by radio-
frequency (RF) sputtering. The transmittance of the TFT shows larger than 80% cross the …

A study on the degradation mechanism of InGaZnO thin-film transistors under simultaneous gate and drain bias stresses based on the electronic trap characterization

CY Jeong, D Lee, SH Song, JI Kim… - Semiconductor …, 2014 - iopscience.iop.org
We discuss the device degradation mechanism of amorphous indium–gallium–zinc oxide (a-
IGZO) thin-film transistors (TFTs) under simultaneous gate and drain bias stresses based on …

Influence of channel layer thickness on the instability of amorphous SiZnSnO thin film transistors under negative bias temperature stress

BH Lee, SY Lee - physica status solidi (a), 2018 - Wiley Online Library
In this study, amorphous silicon‐zinc‐tin‐oxide thin film transistors (a‐SZTO TFTs) are
fabricated by radio‐frequency magnetron sputtering at room temperature, and the influence …

Positive Gate-Bias Temperature Stability of RF-Sputtered Active-Layer Thin-Film Transistors

YS Tsai, JZ Chen - IEEE transactions on electron devices, 2011 - ieeexplore.ieee.org
This paper investigates the positive gate-bias temperature stability of RF-sputtered bottom-
gate Mg 0.05 Zn 0.95 O active-layer thin-film transistors (TFTs) annealed at 200° C for 5 h …

Enhancement of In-Sn-Ga-O TFT performance by the synergistic combination of UV + O3 radiation and low temperature annealing

HJ Jeong, HM Lee, KT Oh, J Park, JS Park - Journal of Electroceramics, 2016 - Springer
High performance thin film transistors (TFTs) based on amorphous In-Sn-Ga-O (ITGO)
semiconductor were fabricated. In order to activate the electrical properties of the oxide …