Designof Efficient Scan Flip-Flop
B Nagesh, BSN Chandra - 2021 International Conference on …, 2021 - ieeexplore.ieee.org
Design For Testability (DFT) is a technique used while designing the Integrated Circuit (IC)
to add features to the hardware design which helps in testing the design. Scan insertion is …
to add features to the hardware design which helps in testing the design. Scan insertion is …
Developments in scan shift power reduction: a survey
V Sontakke, J Dickhoff - Bulletin of Electrical Engineering and Informatics, 2023 - beei.org
While power reduction during testing is necessary for today's low-power devices, it also
lowers test costs. Scan-based methods are the most widely used approach for testing …
lowers test costs. Scan-based methods are the most widely used approach for testing …
[引用][C] Design and implementation of low power DFT technique for system on chips SoC s
Y Avinash - 2020 - shodhganga.inflibnet.ac.in
Shodhganga@INFLIBNET: Design and implementation of low power DFT technique for
system on chips SoC s Skip navigation DSpace logo Home Browse Universities & …
system on chips SoC s Skip navigation DSpace logo Home Browse Universities & …