Growth and branching of CuO nanowires by thermal oxidation of copper
M Kaur, KP Muthe, SK Despande, S Choudhury… - Journal of Crystal …, 2006 - Elsevier
CuO nanowires have been synthesized by thermal oxidation of copper foils in oxygen
atmosphere. Morphology and microstructure of the nanowires was studied as a function of …
atmosphere. Morphology and microstructure of the nanowires was studied as a function of …
Thermal droop in III-nitride based light-emitting diodes: Physical origin and perspectives
This tutorial paper focuses on the physical origin of thermal droop, ie, the decrease in the
luminescence of light-emitting diodes (LEDs) induced by increasing temperature. III-nitride …
luminescence of light-emitting diodes (LEDs) induced by increasing temperature. III-nitride …
Measuring the internal quantum efficiency of light-emitting diodes: Towards accurate and reliable room-temperature characterization
For accurate and reliable measurement of the internal quantum efficiency (IQE) of light-
emitting diodes (LEDs), the method should be theoretically solid and experimentally simple …
emitting diodes (LEDs), the method should be theoretically solid and experimentally simple …
Structural, optical, and electronic properties of colloidal CuO nanoparticles formed by using a colloid-thermal synthesis process
DI Son, CH You, TW Kim - Applied surface science, 2009 - Elsevier
Colloidal cupric oxide (CuO) nanoparticles were formed by using a colloid-thermal synthesis
process. X-ray diffraction patterns, transmission electron microscopy (TEM) images, high …
process. X-ray diffraction patterns, transmission electron microscopy (TEM) images, high …
Understanding efficiency droop effect in InGaN/GaN multiple-quantum-well blue light-emitting diodes with different degree of carrier localization
Two light-emitting diode samples are grown with InGaN and GaN underlying layers beneath
the multiple quantum wells (MQWs), respectively. By measuring the carrier lifetime as a …
the multiple quantum wells (MQWs), respectively. By measuring the carrier lifetime as a …
Microstructural origin of leakage current in GaN/InGaN light-emitting diodes
XA Cao, JA Teetsov, F Shahedipour-Sandvik… - Journal of crystal …, 2004 - Elsevier
A combination of atomic force microscopy (AFM), conductive AFM (C-AFM) and scanning
Kelvin probe microscopy (SKPM) was used to investigate the correlation between the …
Kelvin probe microscopy (SKPM) was used to investigate the correlation between the …
Electrical characteristics of InGaN∕ GaN light-emitting diodes grown on GaN and sapphire substrates
XA Cao, JM Teetsov, MP D'evelyn, DW Merfeld… - Applied Physics …, 2004 - pubs.aip.org
We report on the electrical characteristics of InGaN/GaN multiple-quantum-well light-emitting
diodes (LEDs) grown on sapphire and free-standing GaN substrates. As a result of defect …
diodes (LEDs) grown on sapphire and free-standing GaN substrates. As a result of defect …
Study of droop phenomena in InGaN-based blue and green light-emitting diodes by temperature-dependent electroluminescence
InGaN-based blue and green light-emitting diodes are studied by temperature-dependent
electroluminescence (EL) from 300 to 50 K to elucidate the effects of carrier overflow and the …
electroluminescence (EL) from 300 to 50 K to elucidate the effects of carrier overflow and the …
A model for steady-state luminescence of localized-state ensemble
A distribution function for localized carriers, f (E, T)= 1/(e (E− E a)/k B T+ τ tr/τ r), is obtained
by solving a rate equation, in which electrical carriers' generation, thermal escape, recapture …
by solving a rate equation, in which electrical carriers' generation, thermal escape, recapture …
Current-and temperature-dependent efficiency droops in InGaN-based blue and AlGaInP-based red light-emitting diodes
We investigate the current-dependent and temperature-dependent efficiency droops (" J-
droop" and" T-droop", respectively) in InGaN-based blue and AlGaInP-based red light …
droop" and" T-droop", respectively) in InGaN-based blue and AlGaInP-based red light …