Growth and branching of CuO nanowires by thermal oxidation of copper

M Kaur, KP Muthe, SK Despande, S Choudhury… - Journal of Crystal …, 2006 - Elsevier
CuO nanowires have been synthesized by thermal oxidation of copper foils in oxygen
atmosphere. Morphology and microstructure of the nanowires was studied as a function of …

Thermal droop in III-nitride based light-emitting diodes: Physical origin and perspectives

M Meneghini, C De Santi, A Tibaldi, M Vallone… - Journal of applied …, 2020 - pubs.aip.org
This tutorial paper focuses on the physical origin of thermal droop, ie, the decrease in the
luminescence of light-emitting diodes (LEDs) induced by increasing temperature. III-nitride …

Measuring the internal quantum efficiency of light-emitting diodes: Towards accurate and reliable room-temperature characterization

JI Shim, DS Shin - Nanophotonics, 2018 - degruyter.com
For accurate and reliable measurement of the internal quantum efficiency (IQE) of light-
emitting diodes (LEDs), the method should be theoretically solid and experimentally simple …

Structural, optical, and electronic properties of colloidal CuO nanoparticles formed by using a colloid-thermal synthesis process

DI Son, CH You, TW Kim - Applied surface science, 2009 - Elsevier
Colloidal cupric oxide (CuO) nanoparticles were formed by using a colloid-thermal synthesis
process. X-ray diffraction patterns, transmission electron microscopy (TEM) images, high …

Understanding efficiency droop effect in InGaN/GaN multiple-quantum-well blue light-emitting diodes with different degree of carrier localization

J Wang, L Wang, W Zhao, Z Hao, Y Luo - Applied Physics Letters, 2010 - pubs.aip.org
Two light-emitting diode samples are grown with InGaN and GaN underlying layers beneath
the multiple quantum wells (MQWs), respectively. By measuring the carrier lifetime as a …

Microstructural origin of leakage current in GaN/InGaN light-emitting diodes

XA Cao, JA Teetsov, F Shahedipour-Sandvik… - Journal of crystal …, 2004 - Elsevier
A combination of atomic force microscopy (AFM), conductive AFM (C-AFM) and scanning
Kelvin probe microscopy (SKPM) was used to investigate the correlation between the …

Electrical characteristics of InGaN∕ GaN light-emitting diodes grown on GaN and sapphire substrates

XA Cao, JM Teetsov, MP D'evelyn, DW Merfeld… - Applied Physics …, 2004 - pubs.aip.org
We report on the electrical characteristics of InGaN/GaN multiple-quantum-well light-emitting
diodes (LEDs) grown on sapphire and free-standing GaN substrates. As a result of defect …

Study of droop phenomena in InGaN-based blue and green light-emitting diodes by temperature-dependent electroluminescence

DS Shin, DP Han, JY Oh, JI Shim - Applied Physics Letters, 2012 - pubs.aip.org
InGaN-based blue and green light-emitting diodes are studied by temperature-dependent
electroluminescence (EL) from 300 to 50 K to elucidate the effects of carrier overflow and the …

A model for steady-state luminescence of localized-state ensemble

Q Li, SJ Xu, MH Xie, SY Tong - Europhysics Letters, 2005 - iopscience.iop.org
A distribution function for localized carriers, f (E, T)= 1/(e (E− E a)/k B T+ τ tr/τ r), is obtained
by solving a rate equation, in which electrical carriers' generation, thermal escape, recapture …

Current-and temperature-dependent efficiency droops in InGaN-based blue and AlGaInP-based red light-emitting diodes

CH Oh, JI Shim, DS Shin - Japanese Journal of Applied Physics, 2019 - iopscience.iop.org
We investigate the current-dependent and temperature-dependent efficiency droops (" J-
droop" and" T-droop", respectively) in InGaN-based blue and AlGaInP-based red light …