Recent development of gallium oxide thin film on GaN
HS Oon, KY Cheong - Materials science in semiconductor processing, 2013 - Elsevier
Gallium nitride (GaN) has attracted much attention due to its outstanding characteristics. It
may replace conventional semiconductor materials, such as silicon, that are approaching …
may replace conventional semiconductor materials, such as silicon, that are approaching …
Growth and properties of well-crystalline cerium oxide (CeO2) nanoflakes for environmental and sensor applications
This paper reports the synthesis, characterizations and applications of well-crystalline 2D-
cerium oxide (CeO 2) nanoflakes prepared by a rapid and facile solution combustion …
cerium oxide (CeO 2) nanoflakes prepared by a rapid and facile solution combustion …
Annealing temperature modulated interfacial chemistry and electrical characteristics of sputtering-derived HfO2/Si gate stack
J Gao, G He, JW Zhang, B Deng, YM Liu - Journal of Alloys and …, 2015 - Elsevier
Sputtering-derived HfO 2 high-k gate dielectric thin films have been deposited on Si
substrate by means of high vacuum physics vapor deposition method. Via characterization …
substrate by means of high vacuum physics vapor deposition method. Via characterization …
A Review on Potential Use of Cerium Oxide and Doped Cerium Oxide as High Dielectric Constant Seed Layers for Overgrowth of Cerium Oxide Nanostructures
In this review, an introduction to nanostructured films focusing on cerium oxide (CeO2) as
high dielectric constant (k) material for silicon-based metal-oxide-semiconductor devices …
high dielectric constant (k) material for silicon-based metal-oxide-semiconductor devices …
Microstructure, optical and electrical properties of sputtered HfTiO high-k gate dielectric thin films
SS Jiang, G He, J Gao, DQ Xiao, P Jin, WD Li… - Ceramics …, 2016 - Elsevier
The microstructure, optical and electrical properties of HfTiO high-k gate dielectric thin films
deposited on Si substrate and quartz substrate by RF magnetron sputtering have been …
deposited on Si substrate and quartz substrate by RF magnetron sputtering have been …
Effect of Annealing Temperature on the Structural, Optical, and Electrical Properties of Al-Doped ZrO2 Gate Dielectric Films Treated by the Sol–Gel Method
H Cai, K Tuokedaerhan, Z Lu, R Zhang, H Du - Coatings, 2022 - mdpi.com
In this article, we report the preparation of Al-doped ZrO2 (AZO) thin films by the sol–gel
method. The electrical properties, microstructure, and optical properties of AZO high-k gate …
method. The electrical properties, microstructure, and optical properties of AZO high-k gate …
Microstructure, optical and electrical properties of solution-derived peroxo-zirconium oxide gate dielectrics for CMOS application
D Xiao, G He, Z Sun, J Lv, P Jin, C Zheng, M Liu - Ceramics International, 2016 - Elsevier
Solution-processed high-k gate dielectrics for metal-oxide-semiconductor (MOS) capacitor
have been widely investigated with the objective of achieving high performance field effect …
have been widely investigated with the objective of achieving high performance field effect …
Electrochemical investigation of caffeine by cerium oxide nanoparticle modified carbon paste electrode
BM Santhosh, S Manjunatha… - Journal of The …, 2020 - iopscience.iop.org
In the present study, facile electrochemical sensor built on carbon paste electrode modified
with as synthesized CeO 2 nanoparticles (Cerium Oxide Modified Carbon Paste Electrode …
with as synthesized CeO 2 nanoparticles (Cerium Oxide Modified Carbon Paste Electrode …
Effects of post-deposition annealing ambient on Y2O3 gate deposited on silicon by RF magnetron sputtering
Effects of different post-deposition annealing (PDA) ambient [O2, N2O, N2, forming gas
(95% N2-5% H2), and Ar] on the physical and metal–oxide–semiconductor (MOS) …
(95% N2-5% H2), and Ar] on the physical and metal–oxide–semiconductor (MOS) …
Microstructure, optical and dielectric properties of cerium oxide thin films prepared by pulsed laser deposition
Cerium oxide (CeO 2) thin films were deposited on Pt (111)/Ti/SiO 2/Si (100) substrates
using pulsed laser deposition method at different temperatures such as, 300 K, 573 K and …
using pulsed laser deposition method at different temperatures such as, 300 K, 573 K and …