Advanced 3D Through-Si-Via and Solder Bumping Technology: A Review

YJ Jang, A Sharma, JP Jung - Materials, 2023 - mdpi.com
Three-dimensional (3D) packaging using through-Si-via (TSV) is a key technique for
achieving high-density integration, high-speed connectivity, and for downsizing of electronic …

Three-dimensional stacked neural network accelerator architectures for AR/VR applications

L Yang, RM Radway, YH Chen, TF Wu, H Liu… - IEEE Micro, 2022 - ieeexplore.ieee.org
Three-dimensional integration offers architectural and performance benefits for scaling
augmented/virtual reality (AR/VR) models on highly resource-constrained edge devices …

3D-Carbon: An Analytical Carbon Modeling Tool for 3D and 2.5 D Integrated Circuits

Y Zhao, Y Zhao, C Wan, Y Lin - Proceedings of the 61st ACM/IEEE …, 2024 - dl.acm.org
Environmental sustainability is crucial for Integrated Circuits (ICs) across their lifecycle,
particularly in manufacturing and use. Meanwhile, ICs using 3D/2.5 D integration …

Direct Monitoring of Nanoscale Deformations across All Layers in Three-Dimensional Stacked Structures

X Zhao, H Jiang, J Liu, C Liu, H Deng, R Zhou… - ACS …, 2024 - ACS Publications
Due to its high bandwidth, low latency, low power consumption, and compact size, three-
dimensional (3D) integration of semiconductor chips holds the promise of boosting the …

On continuing dnn accelerator architecture scaling using tightly coupled compute-on-memory 3-d ics

G Murali, A Iyer, L Zhu, J Tong… - … Transactions on Very …, 2023 - ieeexplore.ieee.org
This work identifies the architectural and design scaling limits of 2-D flexible interconnect
deep neural network (DNN) accelerators and addresses them with 3-D ICs. We demonstrate …

Power delivery solutions and PPA impacts in micro-bump and hybrid-bonding 3D ICs

L Zhu, C Jo, SK Lim - IEEE Transactions on Components …, 2022 - ieeexplore.ieee.org
Face-to-face bonded 3D integration has been shown to provide remarkable performance
and power benefits for next-generation computing systems, but power delivery remains a …

Mixed-Size 3D Analytical Placement with Heterogeneous Technology Nodes

YJ Chen, CH Hsieh, PH Su, SH Chen… - Proceedings of the 61st …, 2024 - dl.acm.org
This paper proposes a mixed-size 3D analytical placement framework for face-to-face
stacked integrated circuits fabricated with heterogeneous technology nodes and connected …

Design Automation Needs for Monolithic 3D ICs: Accomplishments and Gaps

L Zhu, SK Lim - 2023 60th ACM/IEEE Design Automation …, 2023 - ieeexplore.ieee.org
In this paper, we provide an overview of design automation tools and methodology for
Monolithic 3D ICs, focusing on the accomplishments in recent years and the gaps that …

Quantifying the Electrical Impact of Bonding Misalignment for 0.5 μm Pitch Hybrid Bonding Structures

K Ryan, N Ip, C Netzband, KC Chien… - 2024 IEEE 74th …, 2024 - ieeexplore.ieee.org
A 0.5 μm pitch multi-level back-end-of-line (BEOL) test vehicle was developed to evaluate
the performance of the wafer-to-wafer (W2W) bonding tool platform. Test structures with …