Advanced 3D Through-Si-Via and Solder Bumping Technology: A Review
YJ Jang, A Sharma, JP Jung - Materials, 2023 - mdpi.com
Three-dimensional (3D) packaging using through-Si-via (TSV) is a key technique for
achieving high-density integration, high-speed connectivity, and for downsizing of electronic …
achieving high-density integration, high-speed connectivity, and for downsizing of electronic …
Three-dimensional stacked neural network accelerator architectures for AR/VR applications
Three-dimensional integration offers architectural and performance benefits for scaling
augmented/virtual reality (AR/VR) models on highly resource-constrained edge devices …
augmented/virtual reality (AR/VR) models on highly resource-constrained edge devices …
3D-Carbon: An Analytical Carbon Modeling Tool for 3D and 2.5 D Integrated Circuits
Environmental sustainability is crucial for Integrated Circuits (ICs) across their lifecycle,
particularly in manufacturing and use. Meanwhile, ICs using 3D/2.5 D integration …
particularly in manufacturing and use. Meanwhile, ICs using 3D/2.5 D integration …
Direct Monitoring of Nanoscale Deformations across All Layers in Three-Dimensional Stacked Structures
Due to its high bandwidth, low latency, low power consumption, and compact size, three-
dimensional (3D) integration of semiconductor chips holds the promise of boosting the …
dimensional (3D) integration of semiconductor chips holds the promise of boosting the …
On continuing dnn accelerator architecture scaling using tightly coupled compute-on-memory 3-d ics
This work identifies the architectural and design scaling limits of 2-D flexible interconnect
deep neural network (DNN) accelerators and addresses them with 3-D ICs. We demonstrate …
deep neural network (DNN) accelerators and addresses them with 3-D ICs. We demonstrate …
Power delivery solutions and PPA impacts in micro-bump and hybrid-bonding 3D ICs
Face-to-face bonded 3D integration has been shown to provide remarkable performance
and power benefits for next-generation computing systems, but power delivery remains a …
and power benefits for next-generation computing systems, but power delivery remains a …
Mixed-Size 3D Analytical Placement with Heterogeneous Technology Nodes
YJ Chen, CH Hsieh, PH Su, SH Chen… - Proceedings of the 61st …, 2024 - dl.acm.org
This paper proposes a mixed-size 3D analytical placement framework for face-to-face
stacked integrated circuits fabricated with heterogeneous technology nodes and connected …
stacked integrated circuits fabricated with heterogeneous technology nodes and connected …
Design Automation Needs for Monolithic 3D ICs: Accomplishments and Gaps
In this paper, we provide an overview of design automation tools and methodology for
Monolithic 3D ICs, focusing on the accomplishments in recent years and the gaps that …
Monolithic 3D ICs, focusing on the accomplishments in recent years and the gaps that …
Quantifying the Electrical Impact of Bonding Misalignment for 0.5 μm Pitch Hybrid Bonding Structures
K Ryan, N Ip, C Netzband, KC Chien… - 2024 IEEE 74th …, 2024 - ieeexplore.ieee.org
A 0.5 μm pitch multi-level back-end-of-line (BEOL) test vehicle was developed to evaluate
the performance of the wafer-to-wafer (W2W) bonding tool platform. Test structures with …
the performance of the wafer-to-wafer (W2W) bonding tool platform. Test structures with …