This paper presents a brief history of scanning probe microscopes (SPMs) and a general
insight into an atomic force microscope (AFM), including its operating principles, modes …

In most nanotechnology applications, speed and precision are important requirements for
obtaining good topographical maps of material surfaces using atomic force microscopes …

This article compares the imaging performance of non‐traditional scanning patterns for
scanning probe microscopy including sinusoidal raster, spiral, and Lissajous patterns. The …

In a scanning probe microscope (SPM), the image is obtained by scanning a sample relative
to a physical probe which captures the topography. The conventional scanning method is a …

An optimal controller for high-precision spiral positioning of a piezoelectric tube scanner
used in an atomic force microscope (AFM) is proposed in this paper. In the proposed control …

In this paper, a robust controller for the positioning of a piezoelectric tube scanner (PTS)
used in an atomic force microscope (AFM) is proposed. A minimax linear quadratic …

We report an extension of a recent LQG control method to track reference signals by which a
constant-linear-velocity (CLV) spiral scan pattern is generated. In contrast to the constant …

The design of a phase-locked loop (PLL)-based proportional integral (PI) controller for
compensating the phase error between motions from the lateral axes of a piezoelectric tube …

We report an Approximate Internal Model Control (AIMC) method for tracking of the
reference signals by which a constant-linear-velocity (CLV) spiral scan pattern is generated …

Model predictive control (MPC) is a multivariable control algorithm commonly used when
tracking a reference trajectory is the primary goal. It minimizes the steady-state tracking …