Creep fatigue models of solder joints: A critical review
EH Wong, WD Van Driel, A Dasgupta… - Microelectronics Reliability, 2016 - Elsevier
The goal of creep fatigue modelling is the compounding of the damage caused by creep and
fatigue mechanisms. The different approaches for compounding these damage mechanisms …
fatigue mechanisms. The different approaches for compounding these damage mechanisms …
A review of board level solder joints for mobile applications
EH Wong, SKW Seah, VPW Shim - Microelectronics Reliability, 2008 - Elsevier
The reliability of electronics under drop-shock conditions has attracted significant interest in
recent years due to the widespread use of mobile electronic products. This review focuses …
recent years due to the widespread use of mobile electronic products. This review focuses …
Effect of aging on the high strain rate mechanical properties of SAC105 and SAC305 leadfree alloys
Electronics subjected to shock and vibration may experience strain rates of 1-100 sec-1.
High strain rate data is scarce for leadfree solders at strain rates in the range of 1-100 sec-1 …
High strain rate data is scarce for leadfree solders at strain rates in the range of 1-100 sec-1 …
An improved unified creep-plasticity model for SnAgCu solder under a wide range of strain rates
Based on the unified creep and plasticity theory, an improved constitutive model is proposed
in this study to describe the uniaxial mechanical behaviour of Sn3. 0Ag0. 5Cu (SAC305) …
in this study to describe the uniaxial mechanical behaviour of Sn3. 0Ag0. 5Cu (SAC305) …
Understanding the impact response of lead-free solder at high strain rates
As resistance to drop impact is a standardized evaluation for consumer electronics, the
dynamic behaviour of solder material is critical to ensure the prediction accuracy about …
dynamic behaviour of solder material is critical to ensure the prediction accuracy about …
The effects of precipitation strengthening and solid solution strengthening on strain rate sensitivity of lead-free solders
S Liu, S McDonald, K Sweatman, K Nogita - Microelectronics Reliability, 2018 - Elsevier
Electronic devices are increasingly portable, and often susceptible to damage during
handling, transportation, and service. Because of the great variety of stresses to which …
handling, transportation, and service. Because of the great variety of stresses to which …
Reliability study of board-level lead-free interconnections under sequential thermal cycling and drop impact
B Zhang, H Ding, X Sheng - Microelectronics Reliability, 2009 - Elsevier
The sequential thermal cycling (TC) and drop impact test are more reasonable to evaluate
the reliability of lead-free solder interconnections compared with separate TC test or drop …
the reliability of lead-free solder interconnections compared with separate TC test or drop …
[图书][B] Constrained deformation of materials: devices, heterogeneous structures and thermo-mechanical modeling
YL Shen - 2010 - books.google.com
" Constrained Deformation of Materials: Devices, Heterogeneous Structures and Thermo-
Mechanical Modeling" is an in-depth look at the mechanical analyses and modeling of …
Mechanical Modeling" is an in-depth look at the mechanical analyses and modeling of …
Simulation of dynamic fracture along solder-pad interfaces using a cohesive zone model
J Jing, F Gao, J Johnson… - ASME …, 2008 - asmedigitalcollection.asme.org
In this paper, dynamic fracture of a single solder joint specimen is numerically simulated
using the finite element method. The solder-IMC and IMC-Cu pad interfaces are modeled as …
using the finite element method. The solder-IMC and IMC-Cu pad interfaces are modeled as …
Strain rate effects and rate-dependent constitutive models of lead-based and lead-free solders
F Qin, T An, N Chen - 2010 - asmedigitalcollection.asme.org
As traditional lead-based solders are banned and replaced by lead-free solders, the drop
impact reliability is becoming increasingly crucial because there is little understanding of …
impact reliability is becoming increasingly crucial because there is little understanding of …