半导体激光器列阵的smile 效应与封装技术

王祥鹏, 李再金, 刘云, 王立军 - Optics and Precision …, 2010 - opticsjournal.net
摘要为了减小半导体激光器列阵在封装过程中引入热应力而产生的smile 效应,
提高半导体激光器列阵光束质量, 利用对半导体激光器列阵发光点成像放大的方法 …

Thermomechanical behavior of conduction-cooled high-power diode laser arrays

Z Nie, Y Lu, T Chen, P Zhang, D Wu… - IEEE Transactions …, 2018 - ieeexplore.ieee.org
Thermomechanical behavior has an important effect on reliability and lifetime of high-power
diode lasers (HPDLs). Finite-element analysis (FEA) model and analytical solution model of …

大功率二极管激光线阵的“smile” 测量方法

郭林辉, 唐淳, 武德勇, 高松信, 雷军, 蒋建锋… - 强激光与粒子束, 2009 - hplpb.com.cn
二极管激光线阵封装中产生的“smile” 现象对激光器的激射特性, 寿命, 光束质量等都会产生较大
的影响. 采用高分辨率CCD, 快轴准直透镜及柱面透镜组成的单轴放大系统对激光线阵发光单元 …

[PDF][PDF] 探针扫描法快速测量半导体激光阵列Smile 效应

贾冠男, 尧舜, 潘飞, 高祥宇, 王智勇 - 红外与激光工程, 2015 - researching.cn
摘要院为克服传统光学方法测量半导体激光阵列(LDA) Smile 效应时存在的光学系统搭建精度
要求高, 测试人员素质要求高, 后期数据处理繁杂测量时间长等缺点, 通过用机械接触式台阶仪的 …

基于外腔反馈二极管线阵列的smile 效应测量方法

李景, 曹银花, 刘友强, 许商瑞, 秦文斌… - Chinese Journal of …, 2017 - opticsjournal.net
摘要采用外建激光谐振腔, 在低于原芯片阈值的电流激励下对LDA 的每个发光点进行单独测量,
从而分析整个半导体激光阵列(LDA) 的smile 效应. 实验中利用镀膜反射率大于半导体前腔面的 …

The SMILE Effect in the Beam Propagation Direction Affects the Beam Shaping of a Semiconductor Laser Bar Array

H Zhang, Y Hu, S Peng, Y Liu - Photonics, 2024 - mdpi.com
Near-field bending of a laser diode bar (ie, the SMILE effect) degrades the laser beam
brightness, adversely affecting optical coupling and beam shaping. Previous reports mainly …

Theoretical study on beam quality and thermal stability in solid-state zigzag tube laser amplifier

B Tian, J Yu, B Zhang - Optical Engineering, 2020 - spiedigitallibrary.org
Compared to zig-zag solid-state slab lasers, zig-zag solid-state tube lasers (SSZTLs) exhibit
significant potential in beam quality improvement and output power enhancement. However …

Influence of storage causing packaging stress changes on smile effect for diode laser arrays

H Xu, Y Zhang, Y Fang, X Liu, J Niu… - … and Imaging 2013 …, 2013 - spiedigitallibrary.org
The smile effect is caused by the thermal stress in the packaging process. If packaging
technology of a diode laser array is poor, smile effect will be very bad and the smile effect …

Analysis of the imaging method for assessment of the smile of laser diode bars

L Martí-López, JA Ramos-de-Campos, WD Furlan - Applied optics, 2009 - opg.optica.org
We study imaging systems designed to assess the smile of laser diode bars (LDBs). The
magnification matrix is derived from the required sampling period and the geometries of the …

Testing and characterization of high power semiconductor lasers

X Liu, W Zhao, L Xiong, H Liu, X Liu, W Zhao… - Packaging of High …, 2015 - Springer
High power semiconductor laser is a compact and precision optoelectronic device
manufactured by a series of complicated fabrication processes. The performances of a …