[HTML][HTML] Functionalized fiber-based strain sensors: pathway to next-generation wearable electronics

Z Liu, T Zhu, J Wang, Z Zheng, Y Li, J Li, Y Lai - Nano-micro letters, 2022 - Springer
Wearable strain sensors are arousing increasing research interests in recent years on
account of their potentials in motion detection, personal and public healthcare, future …

Focused electron beam induced deposition meets materials science

M Huth, F Porrati, OV Dobrovolskiy - Microelectronic Engineering, 2018 - Elsevier
Focused electron beam induced deposition (FEBID) is a direct-write method for the
fabrication of nanostructures whose lateral resolution rivals that of advanced electron beam …

[HTML][HTML] Roadmap for focused ion beam technologies

K Höflich, G Hobler, FI Allen, T Wirtz, G Rius… - Applied Physics …, 2023 - pubs.aip.org
The focused ion beam (FIB) is a powerful tool for fabrication, modification, and
characterization of materials down to the nanoscale. Starting with the gallium FIB, which was …

[HTML][HTML] An ultrahigh resolution pressure sensor based on percolative metal nanoparticle arrays

M Chen, W Luo, Z Xu, X Zhang, B Xie, G Wang… - Nature …, 2019 - nature.com
Tunneling conductance among nanoparticle arrays is extremely sensitive to the spacing of
nanoparticles and might be applied to fabricate ultra-sensitive sensors. Such sensors are of …

[HTML][HTML] Coordination and organometallic precursors of group 10 and 11: Focused electron beam induced deposition of metals and insight gained from chemical …

I Utke, P Swiderek, K Höflich, K Madajska… - Coordination Chemistry …, 2022 - Elsevier
Nanostructured materials made from group 10 (Ni, Pd, Pt) and group 11 (Cu, Ag, Au)
elements have outstanding technological relevance in microelectronics, nano-optics …

Discovering and Dissecting Mechanically Excited Luminescence of Mn2+ Activators via Matrix Microstructure Evolution

JC Zhang, N Gao, L Li, S Wang, X Shi… - Advanced Functional …, 2021 - Wiley Online Library
Mechanoluminescent (ML) materials featuring renewable mechanical‐to‐optical conversion
have shown promising prospects in stress sensing, lighting, and display. However, the …

[HTML][HTML] Cantilever-based sensors for high speed atomic force microscopy

BO Alunda, YJ Lee - Sensors, 2020 - mdpi.com
This review critically summarizes the recent advances of the microcantilever-based force
sensors for atomic force microscope (AFM) applications. They are one the most common …

[HTML][HTML] Living up to its potential—Direct-write nanofabrication with focused electron beams

M Huth, F Porrati, S Barth - Journal of Applied Physics, 2021 - pubs.aip.org
Over its rather long history, focused electron beam induced deposition (FEBID) has mostly
been used as an auxiliary process in passivating surfaces in sample preparation for …

Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing

MG Ruppert, SI Moore, M Zawierta, AJ Fleming… - …, 2019 - iopscience.iop.org
Atomic force microscope (AFM) cantilevers with integrated actuation and sensing provide
several distinct advantages over conventional cantilever instrumentation. These include …

[HTML][HTML] Additive Manufacturing of Co3Fe Nano-Probes for Magnetic Force Microscopy

R Winkler, M Brugger-Hatzl, LM Seewald, D Kuhness… - Nanomaterials, 2023 - mdpi.com
Magnetic force microscopy (MFM) is a powerful extension of atomic force microscopy (AFM),
which mostly uses nano-probes with functional coatings for studying magnetic surface …