Since the last century, the exponential growth of the semiconductor industry has led to the
creation of tiny and complex integrated circuits, eg, sensors, actuators, and smart power …

This paper is devoted to local parametric fault diagnosis of nonlinear analog integrated
circuits designed in a bipolar and CMOS technology. An algorithm is proposed that allows …

The safety assessment of cyber-physical systems (CPSs) requires tremendous effort, as the
complexity of cyber-physical systems is increasing. A well-known approach for the safety …

A fault coverage analysis has become an important tool to evaluate the testability of
developing circuits and to come up with an effective test plan. However, the fault coverage …

An analog fault diagnosis approach using a systematic step-by-step test is proposed for fault
detection and location in analog circuits with component tolerance and limited accessible …

The growing size of analog IPs has made targeted structural testing of such designs a
challenging problem. We present a gradient-based automated test generation framework for …

This paper presents two approaches to characterize RF circuits with built-in differential
temperature measurements, namely the homodyne and heterodyne methods. Both non …

摘要提出了一种基于统计理论与神经网络数据融合, 可用于容差模拟电路软故障检测与定位的
诊断方法. 该方法将故障诊断分两个阶段进行, 即故障检测与故障定位. 通过监测可测点工作电压 …

摘要简单分析了目前基于脉冲峰值-时间序列的局部放电检测系统在模式识别功能上存在的缺陷.
提出利用基于单个脉冲波形的宽带检测技术研制多局放检测与模式识别系统 …

This paper proposes a static linear behavior (SLB) analog fault model for switched-capacitor
(SC) circuits. The SC circuits under test (CUT) are divided into functional macros including …