Research progress of hybrid bonding technology for three-dimensional integration

A Zhou, Y Zhang, F Ding, Z Lian, R Jin, Y Yang… - Microelectronics …, 2024 - Elsevier
Computing power based artificial intelligence will profoundly change the productivity and
production relations, and the integrated circuit industry begin to rely on three-dimensional …

Time-dependent evolution study of Ar/N2 plasma-activated Cu surface for enabling two-step Cu-Cu direct bonding in a non-vacuum environment

L Hu, SCK Goh, J Tao, YD Lim, P Zhao… - ECS Journal of Solid …, 2021 - iopscience.iop.org
In this paper, a two-step copper-copper direct bonding process in a non-vacuum
environment is reported. Time-dependent evolution of argon/nitrogen plasma-activated …

Two-Step Ar/N2 Plasma-Activated Al Surface for Al-Al Direct Bonding

L Hu, YD Lim, P Zhao, MJZ Lim… - 2022 IEEE 72nd …, 2022 - ieeexplore.ieee.org
In this study, two-step argon/nitrogen plasma-activated aluminum surface for aluminum-
aluminum direct bonding is reported. Surfaces from the as-deposited and the argon/nitrogen …

Multi-die to wafer bonding through plasma-activated Cu-Cu direct bonding in ambient conditions

L Hu, SCK Goh, YD Lim, P Zhao… - … IEEE International 3D …, 2021 - ieeexplore.ieee.org
In this work, we study multi-die to wafer bonding through plasma-activated Cu-Cu direct
bonding carried out at room temperature in cleanroom ambient conditions. During the pre …

The effect of temperature on the mechanisms of Cu nanoparticle sintering: A molecular dynamic study

Z Wang, Z Song, W Luo, T Shang, Z Liu, J Yuan… - Powder Technology, 2024 - Elsevier
Surface diffusion is considered the primary mechanism for low temperature sintering
properties of Cu nano-solders. However, how surface diffusion affects the sintering quality …

Sputtered copper nitride-copper nitride direct bonding

L Hu, SCK Goh, S Wu, CS Tan - 2021 7th International …, 2021 - ieeexplore.ieee.org
A thin layer of copper nitride is sputtered onto silicon wafers by applying nitrogen plasma
onto a copper target in a sputtering vacuum chamber. Some of the as-sputtered copper …

Copper-to-copper direct bonding process using current-induced enhancement method

B Kwak, J Lee, S Yoon, B Yoo - 2023 IEEE 73rd Electronic …, 2023 - ieeexplore.ieee.org
In this paper, an alternative copper-to-copper direct bonding method is investigated through
electric current-induced bonding, which is the enhancement method for forming copper-to …

Systematic investigation and characterization of Ag paste for LED die attach

L Hu, J Tao, S Bao, SCK Goh, YD Lim… - 2021 IEEE 23rd …, 2021 - ieeexplore.ieee.org
In this paper, the bonding parameters of Ag paste are optimized for LED die attach. The Ag
paste is characterized for its shear strength, hermeticity and morphology. It is found that a …

Plasma-activated Cu-Cu direct bonding in ambient for die-die and die-wafer bonding

L Hu, YD Lim, P Zhao, MJZ Lim… - 2022 6th IEEE Electron …, 2022 - ieeexplore.ieee.org
High-throughput Ar/N 2 plasma-activated Cu-Cu direct bonding for die-die and die-wafer
bonding is demonstrated at room temperature in ambient conditions. Before bonding, the Cu …

Comparative Study of Die-Attach Materials for LED Die Bonding

L Hu, S Bao, Y Wang, SCK Goh, YD Lim… - 2022 IEEE 24th …, 2022 - ieeexplore.ieee.org
In this work, the bonding conditions of different die-attach materials are optimized for LED
die to substrate bonding. The die-attach materials are characterized for their mechanical …