[HTML][HTML] Perspective: Toward efficient GaN-based red light emitting diodes using europium doping

B Mitchell, V Dierolf, T Gregorkiewicz… - Journal of Applied …, 2018 - pubs.aip.org
While InGaN/GaN blue and green light-emitting diodes (LEDs) are commercially available,
the search for an efficient red LED based on GaN is ongoing. The realization of this LED is …

Implantation damage formation in a-, c-and m-plane GaN

K Lorenz, E Wendler, A Redondo-Cubero, N Catarino… - Acta Materialia, 2017 - Elsevier
Epitaxial GaN layers with a-, c-and m-plane surface orientations were implanted with 300
keV Ar-ions at 15 K with fluences ranging from 2× 10 12 to 4× 10 16 at/cm 2. Damage build …

Identification of the prime optical center in

IS Roqan, KP O'Donnell, RW Martin, PR Edwards… - Physical Review B …, 2010 - APS
We identify a dominant light-emitting center in ion-implanted GaN: Eu 3+ for which the lattice
damage has been completely healed, according to x-ray diffraction and Rutherford …

[HTML][HTML] Extracting defect profiles in ion-implanted GaN from ion channeling

A Caçador, P Jóźwik, S Magalhães, JG Marques… - Materials Science in …, 2023 - Elsevier
Ion implantation offers many advantages for material doping, namely a meticulous control
over various parameters such as implantation area, fluence, energy, etc. However, ion …

High pressure annealing of Europium implanted GaN

K Lorenz, SMC Miranda, E Alves… - … and Devices VII, 2012 - spiedigitallibrary.org
GaN epilayers were implanted with Eu to fluences of 1× 10 13 Eu/cm 2 and 1× 10 15 Eu/cm
2. Post-implant thermal annealing was performed in ultra-high nitrogen pressures at …

Utilization of native oxygen in Eu (RE)-doped GaN for enabling device compatibility in optoelectronic applications

B Mitchell, D Timmerman, J Poplawsky, W Zhu, D Lee… - Scientific reports, 2016 - nature.com
The detrimental influence of oxygen on the performance and reliability of V/III nitride based
devices is well known. However, the influence of oxygen on the nature of the incorporation …

A mechanism for damage formation in GaN during rare earth ion implantation at medium range energy and room temperature

P Ruterana, B Lacroix, K Lorenz - Journal of Applied Physics, 2011 - pubs.aip.org
A detailed investigation of the crystallographic damage has been carried out in GaN
following 300 keV rare earth ion implantation at room temperature by varying the fluence …

Ion Implantation into Nonconventional GaN Structures

K Lorenz - Physics, 2022 - mdpi.com
Despite more than two decades of intensive research, ion implantation in group III nitrides is
still not established as a routine technique for doping and device processing. The main …

Doping β-Ga2O3 with europium: influence of the implantation and annealing temperature

M Peres, K Lorenz, E Alves, E Nogales… - Journal of Physics D …, 2017 - iopscience.iop.org
Abstract β-Ga 2 O 3 bulk single crystals were doped by ion implantation at temperatures
from room temperature to 1000 C, using a 300 keV Europium beam with a fluence of 1× 10 …

Mechanisms of Implantation Damage Formation in AlxGa1–xN Compounds

DN Faye, E Wendler, M Felizardo… - The Journal of …, 2016 - ACS Publications
Al x Ga1–x N alloys, covering the entire compositional range (0≤ x≤ 1), were implanted at
room temperature with 200 keV argon (Ar) ions to fluences ranging from 1× 1013 to 2× 1016 …