Dynamic modes of an Atomic Force Microscope (AFM) can be modeled as a cantilever
beam excited near one or more resonant frequencies described by the Euler-Bernoulli PDE …

We present a new digital design of Q-control, ie controllable change of cantilever quality
factor, targeted for digital implementation at an FPGA. The designed Q-controller changes …

Traditional PLLs are circuits synchronizing a generated periodic, usually harmonic, signal
with a reference input signal in frequency (period) and phase. They are sophisticated …

Asymptotic AFM amplitude-phase dynamics is a powerful modeling tool for the development
of AFM control systems and applications. We explain the model and demonstrate simple …

Atomic Force Microscopy (AFM) quantitative measurements are based on optimal
instrumentation and control design, as well as diagnostics, calibration of AFM probes, and …

Capabilities of atomic force microscopy (AFM) for characterization of local electrical
properties of materials are presented in this chapter. At the beginning the probe–sample …

A critical challenge for industrial Atomic Force Microscopes (AFM) is automatic selection of
appropriate probes required for the scanning and measurement tasks (or sequences of …

Landing of the probe is one of the most critical elements of Atomic Force Microscopy (AFM).
However, it remains inadequately studied. Practical implementations of landing usually rely …

Extraction of quantitative nanomechanical data in AFM Resonance modes, such as
Amplitude and Frequency Modulation, is a challenging task. It requires either restoration of …

Abstract Rapidly Oscillating Systems (ROS) is a class of perturbed dynamical systems with a
small parameter that contains oscillating part with the period proportional to the parameter …