Principles of plasma discharges and materials processing

MA Lieberman, AJ Lichtenberg - MRS Bulletin, 1994 - cambridge.org
The authors have done an excellent job of clearly explaining the different nomenclature
used in plasma processing, with the meaning of the symbols and constants commonly …

On the flicker noise in submicron silicon MOSFETs

E Simoen, C Claeys - Solid-State Electronics, 1999 - Elsevier
An overview is given of recent theoretical concepts and experimental findings with respect to
the flicker or 1/f noise in advanced silicon MOSFETs. First, a summary will be given of the …

Modeling of defect generation during plasma etching and its impact on electronic device performance—plasma-induced damage

K Eriguchi - Journal of Physics D: Applied Physics, 2017 - iopscience.iop.org
The increasing demand for the higher performance of ultra-large-scale integration (ULSI)
circuits requires the aggressive shrinkage of device feature sizes in accordance with the …

Achieving atomistic control in materials processing by plasma–surface interactions

J Chang, JP Chang - Journal of Physics D: Applied Physics, 2017 - iopscience.iop.org
The continuous down-scaling of electronic devices and the introduction of functionally
improved novel materials require a greater atomic level controllability in the synthesis and …

Review of plasma-enhanced atomic layer deposition: Technical enabler of nanoscale device fabrication

H Kim, IK Oh - Japanese Journal of Applied Physics, 2014 - iopscience.iop.org
With devices being scaled down to the nanometer regime, the need for atomic thickness
control with high conformality is increasing. Atomic layer deposition (ALD) is a key …

Defect generation in electronic devices under plasma exposure: Plasma-induced damage

K Eriguchi - Japanese Journal of Applied Physics, 2017 - iopscience.iop.org
The increasing demand for higher performance of ULSI circuits requires aggressive
shrinkage of device feature sizes in accordance with Moore's law. Plasma processing plays …

Surface processes in low pressure plasmas

GS Oehrlein - Surface Science, 1997 - Elsevier
In many high technology industries low pressure plasmas have become indispensable for
advanced materials processing: the microelectronics industry employs plasma-based …

Challenges and constraints in designing implantable medical ICs

P Gerrish, E Herrmann, L Tyler… - IEEE Transactions on …, 2005 - ieeexplore.ieee.org
Implantable medical electronics are differentiated from most of the other electronic-system
implementations by their unique combination of extreme low-power and high-reliability …

Interface and plasma damage analysis of PEALD TaCN deposited on HfO2 for advanced CMOS studied by angle resolved XPS and C–V

F Piallat, V Beugin, R Gassilloud, L Dussault… - Applied surface …, 2014 - Elsevier
Plasma enhanced atomic layer deposition (PEALD) TaCN deposited on HfO 2 was studied
by X-ray photoelectron spectroscopy (XPS) to understand the reactions taking place at the …

High‐Resolution Printing‐Based Vertical Interconnects for Flexible Hybrid Electronics

S Ma, AS Dahiya, A Christou, A Zumeit… - Advanced Materials …, 2024 - Wiley Online Library
Flexible hybrid electronics (FHE) is an emerging area that combines printed electronics and
ultra‐thin chip (UTC) technology to deliver high performance needed in applications such as …