A survey on split manufacturing: Attacks, defenses, and challenges

TD Perez, S Pagliarini - IEEE Access, 2020 - ieeexplore.ieee.org
In today's integrated circuit (IC) ecosystem, owning a foundry is not economically viable, and
therefore most IC design houses are now working under a fabless business model. In order …

Pin accessibility-driven detailed placement refinement

Y Ding, C Chu, WK Mak - Proceedings of the 2017 ACM on International …, 2017 - dl.acm.org
The significantly increased number of routing design rules at sub-20nm nodes has made pin
access one of the most critical challenges in detailed routing. Resolving pin access issues in …

Overlay-aware detailed routing for self-aligned double patterning lithography using the cut process

IJ Liu, SY Fang, YW Chang - Proceedings of the 51st Annual Design …, 2014 - dl.acm.org
Self-aligned double patterning (SADP) is one of the most promising techniques for sub-
20nm technology. Spacer-is-dielectric SADP using a cut process is getting popular because …

Directed self-assembly cut mask assignment for unidirectional design

J Ou, B Yu, JR Gao, DZ Pan - Journal of Micro …, 2015 - spiedigitallibrary.org
Recently, directed self-assembly (DSA) has emerged as a promising lithography solution for
cut manufacturing. We perform a comprehensive study on the DSA aware mask optimization …

Directed self-assembly based cut mask optimization for unidirectional design

J Ou, B Yu, JR Gao, DZ Pan, M Preil… - Proceedings of the 25th …, 2015 - dl.acm.org
Unidirectional design has attracted lots of attention with the scaling down of technology
nodes. However, due to the limitation of traditional lithography, printing the randomly …

Layout decomposition co-optimization for hybrid e-beam and multiple patterning lithography

Y Yang, WS Luk, DZ Pan, H Zhou, C Yan… - … on Computer-Aided …, 2015 - ieeexplore.ieee.org
As the feature size keeps scaling down and the circuit complexity increases rapidly, a more
advanced hybrid lithography, which combines multiple patterning and electron-beam …

Double-patterning aware DSA template guided cut redistribution for advanced 1-D gridded designs

ZW Lin, YW Chang - Proceedings of the 2016 on International …, 2016 - dl.acm.org
Directed self-assembly (DSA) technology has emerged as a promising candidate for cut
printing in advanced 1-D gridded layouts, where cuts might need to be redistributed such …

Cut Redistribution With Directed-Self-Assembly Templates for Advanced 1-D Gridded Layouts

ZW Lin, YW Chang - … on Computer-Aided Design of Integrated …, 2017 - ieeexplore.ieee.org
Directed-self-assembly (DSA) technology is a promising candidate for cut printing in sub-
10nm 1-D gridded designs, where cuts might need to be redistributed such that they could …

ILP-based co-optimization of cut mask layout, dummy fill, and timing for sub-14nm BEOL technology

K Han, AB Kahng, H Lee… - Photomask Technology …, 2015 - spiedigitallibrary.org
Self-aligned multiple patterning (SAMP), due to its low overlay error, has emerged as the
leading option for 1D gridded back-end-of-line (BEOL) in sub-14nm nodes. To form actual …

Making split fabrication synergistically secure and manufacturable

L Feng, Y Wang, J Hu, WK Mak… - 2017 IEEE/ACM …, 2017 - ieeexplore.ieee.org
Split fabrication is a promising approach to security against attacks by untrusted foundries.
While existing split fabrication methods consider the overhead of conventional objectives …