This work presents a comprehensive review on radiation hardening techniques aimed at
enhancing the resilience of VLSI circuits against soft errors. The study covers a wide …

Higher density of integration and lower power technologies are becoming more sensitive to
soft errors caused by radiations. Not only memories and latches are being affected but also …

Considering the extensive usage of electronic systems in Spacecraft and harsh radiation
environment in the Space, radiation effects on electronic systems and development of …

This paper investigates the applicability of CMOS decoupling cells for mitigating the Single
Event Transient (SET) effects in standard combinational gates. The concept is based on the …

In the near future of high component density and low-power technologies, soft errors
occurring not only in memory systems and latches but also in the combinational parts of …

Radiation-hardening techniques can be extensively used in the design level to improve the
robustness of very large-scale integration (VLSI) circuits used in space applications …

Reliability and fault tolerance needs in space applications pose additional requirements to
the chip design flow. In order to successfully cope with space related issues, cross-layer …

In a near future of high-density and low-power technologies, the study of soft errors will not
only be relevant for memory systems and latches of logic circuits, but also for the …

The higher density of integration and lower supply voltage have led to lower noise margins
and a smaller amount of charge representing a bit of information. The International …

The reliability of electronic circuits is subject to physical damage or functional failures due to
the influence of the application environment, such as the presence of atmospheric or space …