ARM TrustZone builds a trusted execution environment based on the concept of hardware
separation. It has been quite successful in defending against various software attacks and …

Reliability concerns due to technology scaling have been a major focus of researchers and
designers for several technology nodes. Therefore, many new techniques for enhancing and …

We report on measured radiation-induced soft error rates (SER) of memory and logic
devices built in a 22 nm high-k metal gate bulk Tri-Gate technology. Our results demonstrate …

Physical mechanisms of single-event effects that result in multiple-node charge collection or
charge sharing are reviewed and summarized. A historical overview of observed circuit …

Today, soft errors are one of the major design technology challenges at and beyond the
22nm technology nodes. This article introduces the soft error problem from the perspective …

Neutron-and proton-induced single-event upset cross sections of D-and DICE-Flip/Flops are
analyzed for designs implemented in a 40 nm bulk technology node. Neutron and proton …

We present a first of its kind framework which overcomes a major challenge in the design of
digital systems that are resilient to reliability failures: achieve desired resilience targets at …

There is an invisible enemy that constantly threatens the operation of electronics: ionizing
radiation. From sea level to outer space, ionizing radiation is virtually everywhere. At sea …

In this paper we propose the novel Delta DICE latch that is tolerant to SNUs (Single Node
Upsets) and DNUs (Double Node Upsets). The latch comprises three DICE cells in a delta …

As technology size scales down toward lower two-digit nanometer dimensions, sensitivity of
CMOS circuits to radiation effects increases. Static random access memory cells (SRAMs) …