Photonic-dispersion neural networks for inverse scattering problems

T Li, A Chen, L Fan, M Zheng, J Wang, G Lu… - Light: Science & …, 2021 - nature.com
Inferring the properties of a scattering objective by analyzing the optical far-field responses
within the framework of inverse problems is of great practical significance. However, it still …

Far-field diffraction microscopy at λ/10 resolution

T Zhang, C Godavarthi, PC Chaumet, G Maire… - Optica, 2016 - opg.optica.org
Tomographic diffraction microscopy is a three-dimensional quantitative optical imaging
technique in which the sample is numerically reconstructed from tens of holograms recorded …

Small-size, high-resolution angular displacement measurement technology based on an imaging detector

H Yu, Q Wan, X Lu, Y Du, S Yang - Applied Optics, 2017 - opg.optica.org
It is challenging to design a photoelectric encoder that is small in size while ensuring it has
sufficiently high resolution and accuracy. Traditional displacement measurement via the …

Reconstruction of finite deep sub-wavelength nanostructures by Mueller-matrix scattered-field microscopy

C Wang, X Chen, C Chen, S Sheng, L Song, H Gu… - Optics …, 2021 - opg.optica.org
Computational super-resolution is a novel approach to break the diffraction limit. The
Mueller matrix, which contains full-polarization information about the morphology and …

An optoelectronic detector with high precision for compact grating encoder application

Y Mu, N Hou, C Wang, Y Zhao, K Chen, Y Chi - Electronics, 2022 - mdpi.com
This paper presents a novel optoelectronic detection array that adopts the research idea of
optical, mechanical and electrical integration. Through the design of new detectors and …

Generic characterization method for nano-gratings using deep-neural-network-assisted ellipsometry

Z Jiang, Z Gan, C Liang, WD Li - Nanophotonics, 2024 - degruyter.com
As a non-destructive and rapid technique, optical scatterometry has gained widespread use
in the measurement of film thickness and optical constants. The recent advances in deep …

Angle measurement based on in-line digital holographic reconstruction

H Yu - Optics and Lasers in Engineering, 2021 - Elsevier
Using digital holography technology to reconstruct the optical information of the calibrated
grating, the grating pattern can be magnified without an optical lens. This greatly reduces the …

Optimizing illumination for precise multi-parameter estimations in coherent diffractive imaging

D Bouchet, J Seifert, AP Mosk - Optics Letters, 2021 - opg.optica.org
Coherent diffractive imaging (CDI) is widely used to characterize structured samples from
measurements of diffracting intensity patterns. We introduce a numerical framework to …

An anti-spot, high-precision subdivision algorithm for linear CCD based single-track absolute encoder

P Yuan, D Huang, Z Lei, C Xu - Measurement, 2019 - Elsevier
To improve precision performance of angular sensor, in this paper, research is performed on
subdivision technology for a single-track absolute photoelectrical encoder. Firstly, a robust …

Through-focus scanning optical microscopy with the Fourier modal method

S Park, G Park, Y Kim, JH Cho, J Lee, H Kim - Optics Express, 2018 - opg.optica.org
We propose a Fourier modal method (FMM) based through-focus scanning optical
microscopy (TSOM) featuring sub-nano scale measurement tolerance. TSOM is very …