Photonic-dispersion neural networks for inverse scattering problems
Inferring the properties of a scattering objective by analyzing the optical far-field responses
within the framework of inverse problems is of great practical significance. However, it still …
within the framework of inverse problems is of great practical significance. However, it still …
Far-field diffraction microscopy at λ/10 resolution
T Zhang, C Godavarthi, PC Chaumet, G Maire… - Optica, 2016 - opg.optica.org
Tomographic diffraction microscopy is a three-dimensional quantitative optical imaging
technique in which the sample is numerically reconstructed from tens of holograms recorded …
technique in which the sample is numerically reconstructed from tens of holograms recorded …
Small-size, high-resolution angular displacement measurement technology based on an imaging detector
H Yu, Q Wan, X Lu, Y Du, S Yang - Applied Optics, 2017 - opg.optica.org
It is challenging to design a photoelectric encoder that is small in size while ensuring it has
sufficiently high resolution and accuracy. Traditional displacement measurement via the …
sufficiently high resolution and accuracy. Traditional displacement measurement via the …
Reconstruction of finite deep sub-wavelength nanostructures by Mueller-matrix scattered-field microscopy
Computational super-resolution is a novel approach to break the diffraction limit. The
Mueller matrix, which contains full-polarization information about the morphology and …
Mueller matrix, which contains full-polarization information about the morphology and …
An optoelectronic detector with high precision for compact grating encoder application
Y Mu, N Hou, C Wang, Y Zhao, K Chen, Y Chi - Electronics, 2022 - mdpi.com
This paper presents a novel optoelectronic detection array that adopts the research idea of
optical, mechanical and electrical integration. Through the design of new detectors and …
optical, mechanical and electrical integration. Through the design of new detectors and …
Generic characterization method for nano-gratings using deep-neural-network-assisted ellipsometry
As a non-destructive and rapid technique, optical scatterometry has gained widespread use
in the measurement of film thickness and optical constants. The recent advances in deep …
in the measurement of film thickness and optical constants. The recent advances in deep …
Angle measurement based on in-line digital holographic reconstruction
H Yu - Optics and Lasers in Engineering, 2021 - Elsevier
Using digital holography technology to reconstruct the optical information of the calibrated
grating, the grating pattern can be magnified without an optical lens. This greatly reduces the …
grating, the grating pattern can be magnified without an optical lens. This greatly reduces the …
Optimizing illumination for precise multi-parameter estimations in coherent diffractive imaging
Coherent diffractive imaging (CDI) is widely used to characterize structured samples from
measurements of diffracting intensity patterns. We introduce a numerical framework to …
measurements of diffracting intensity patterns. We introduce a numerical framework to …
An anti-spot, high-precision subdivision algorithm for linear CCD based single-track absolute encoder
P Yuan, D Huang, Z Lei, C Xu - Measurement, 2019 - Elsevier
To improve precision performance of angular sensor, in this paper, research is performed on
subdivision technology for a single-track absolute photoelectrical encoder. Firstly, a robust …
subdivision technology for a single-track absolute photoelectrical encoder. Firstly, a robust …
Through-focus scanning optical microscopy with the Fourier modal method
We propose a Fourier modal method (FMM) based through-focus scanning optical
microscopy (TSOM) featuring sub-nano scale measurement tolerance. TSOM is very …
microscopy (TSOM) featuring sub-nano scale measurement tolerance. TSOM is very …