During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has
grown as a result of the development of the semiconductor industry and the increasing …

The principles and technical aspects of the laboratory energy dispersive x-ray reflectometry
technique (EDXR) are reviewed. X-ray reflectometry enables us to retrieve information on …

The influence of adding nanoparticles on the ascast morphology of spin coated immiscible
polystyrene/poly (methyl methacrylate)(PS/PMMA) thin films of different thickness (h E) and …

We show that an unstable thin polymer bilayer comprising a polystyrene (PS) top and
polymethyl methacrylate (PMMA) bottom layer remains completely stable on a non-wettable …

The glass transition process gets affected in ultrathin films having thickness comparable to
the size of the molecules. We observe systematic broadening of the glass transition …

An X-ray reflectometer has been developed, which can simultaneously measure the whole
specular X-ray reflectivity curve with no need for rotation of the sample, detector or …

The potential of a high speed x-ray reflectometer for time-resolved studies on the subsecond
to millisecond timescales is demonstrated by recording x-ray reflection curves from a small …

This paper describes a method for rapid measurements of the specular X-ray reflectivity
signal using an area detector and a monochromatic, well collimated X-ray beam (divergence …

The effect of atomic layer deposition (ALD) growth temperature on the interfacial
characteristics of p-GaAs MOS capacitors with ALD HfO 2 high-k dielectric using tetrakis …

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