A new digital background calibration technique for pipeline analog to digital converters using decision points of the voltage transfer characteristics

K Ghanbari, E Farshidi, N Alaei Sheini - Analog Integrated Circuits and …, 2024 - Springer
A new technique is introduced for digital background calibration in pipeline analog to digital
converters (ADCs). The technique is based on the decision points of the voltage transfer …

Statistics-based digital background calibration of residue amplifier nonlinearity in pipelined ADCs

H Mafi, M Yargholi, M Yavari - IEEE Transactions on Circuits …, 2018 - ieeexplore.ieee.org
In this paper, a statistics-based digital background calibration technique for pipelined analog-
to-digital converters (ADCs) is presented. This technique employs the residue voltage …

Digital background calibration with histogram of decision points in pipelined ADCs

P Gholami, M Yavari - … Transactions on Circuits and Systems II …, 2017 - ieeexplore.ieee.org
This brief presents a digital background calibration technique for pipelined analog-to-digital
converters (ADCs). It is a histogram-based technique and called the correction with …

Fast background calibration of linear and non-linear errors in pipeline analog-to-digital converters

M Jiani, O Shoaei - IEEE Transactions on Circuits and Systems …, 2021 - ieeexplore.ieee.org
The CMOS scaling and power usage limitations make the calibration techniques inevitable
in the design and implementation of pipeline analog-to-digital converters (ADCs) especially …

A neural network‐based error correction in the first‐stage residue of pipelined analog to digital converters

R Rafieisangari, N Shiri - International Journal of Circuit Theory …, 2024 - Wiley Online Library
An analog background calibration approach is presented for the full calibration of pipeline
analog‐to‐digital converters (ADCs). A well‐trained neural network acts close to the ideal …

Random noise test of analog-to-digital converters

F Alegria - Acta IMEKO, 2023 - acta.imeko.org
The random noise test of analog to digital converters recommended by the IEEE 1057
Standard for digitizing waveform recorders is studied. The heuristically derived expression …

A two-step ADC with statistical calibration

YL Yu, PJ Hurst, BC Levy… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
This paper describes a prototype two-step ADC with adjustable resolution in 40 nm CMOS
technology. It uses a front-end successive-approximation-register ADC and a back-end time …

Nonlinear error analysis and calibration model for cyclic ADCs in large array CMOS image sensors

J Xu, T Li, K Nie, Z Gao - Microelectronics Reliability, 2021 - Elsevier
A mathematical model is established to study the impact of nonlinear errors on the
performance of cyclic analog-to-digital converters (ADCs) and imaging quality of CMOS …

A histogram-based digital background calibration technique for pipelined A/D converters

S Yahyaee, M Yavari - 2022 Iranian International Conference …, 2022 - ieeexplore.ieee.org
This paper presents a digital background calibration technique for pipelined analog-to-
digital converters (ADCs) to correct the gain error due to the capacitors mismatch and finite …

یک روش کالیبراسیون پس‌زمینه دیجیتال برای مبدل‌های آنالوگ به دیجیتال Pipeline با استفاده از تخمین اولیه خطاها و روش‌های مبتنی بر هیستوگرام

میرزاحسینی, محمد, یاوری, محمد - نشریه مهندسی برق و الکترونیک ایران, 2021‎ - jiaeee.com
در این مقاله، یک روش کالیبراسیون دیجیتال برای اصلاح خطاهای مداری موجود در مبدل های آنالوگ به
دیجیتال Pipeline ارائه شده است. این روش شامل دو بخش است که در قسمت اول، یک تخمین اولیه و …