Strain-dependent magnetic ordering switching in 2D AFM ternary V-based chalcogenide monolayers

K Pang, X Xu, Y Wei, T Ying, B Gao, W Li, Y Jiang - Nanoscale, 2023 - pubs.rsc.org
The lack of macroscopic magnetic moments makes antiferromagnetic materials promising
candidates for high-speed spintronic devices. The 2D ternary V-based chalcogenides …

TSV technology and high-energy heavy ions radiation impact review

W Tian, T Ma, X Liu - Electronics, 2018 - mdpi.com
Three-dimensional integrated circuits (3D IC) based on TSV (Through Silicon Via)
technology is the latest packaging technology with the smallest size and quality. As a result …

Synergistic effect of ionization and displacement damage in NPN transistors caused by protons with various energies

X Li, C Liu, J Yang - IEEE Transactions on Nuclear Science, 2015 - ieeexplore.ieee.org
Based on 2N2222 NPN bipolar junction transistors (BJTs), synergistic effect between
ionization and displacement defects induced by 3 MeV, 5 MeV and 10 MeV protons were …

Synergistic effects of NPN transistors caused by combined proton irradiations with different energies

X Li, J Yang, C Liu, G Bai, W Luo, P Li - Microelectronics reliability, 2018 - Elsevier
There are a large number of protons with different energies from the dozens of keV to
hundreds of MeV in space environment, which simultaneously act on the bipolar junction …

The effect of ionization and displacement damage on minority carrier lifetime

J Yang, X Li, C Liu, DM Fleetwood - Microelectronics reliability, 2018 - Elsevier
Based on 1 MeV electrons and 40 MeV Si ion irradiations, the contribution of ionization and
displacement damage to the decrease in the minority carrier lifetime of gate controlled …

Threshold displacement energy of amorphous SiO2: A molecular dynamics study

YB Jiao, YD Wei, WQ Li, XH Cui, ZL Liu… - Journal of Non …, 2023 - Elsevier
Amorphous SiO 2 is a vital insulation or isolation material in modern silicon-based devices
and chips, which is exposed to irradiations of energetic particles when working in space …

The mechanism of the irradiation synergistic effect of silicon bipolar junction transistors explained by multiscale simulations of Monte Carlo and excited-state first …

Z Yang, Y Liu, N An, X Chen - The Journal of Chemical Physics, 2023 - pubs.aip.org
Neutron and γ-ray irradiation damages to transistors are found to be non-additive, and this is
denoted as the irradiation synergistic effect (ISE). Its mechanism is not well-understood. The …

Defect dynamic model of the synergistic effect in neutron-and γ-ray-irradiated silicon NPN transistors

Y Song, H Zhou, XF Cai, Y Liu, P Yang… - … applied materials & …, 2020 - ACS Publications
A defect dynamic model is proposed for the positive synergistic effect of neutron-and γ-ray-
irradiated silicon NPN transistors. The model considers a γ-ray-induced transformation and …

Mechanism of synergistic effects of neutron-and gamma-ray-radiated PNP bipolar transistors

Y Song, Y Zhang, Y Liu, J Zhao, D Meng… - ACS Applied …, 2019 - ACS Publications
The synergistic effects of neutron-and gamma-ray-radiated PNP transistors are
systematically investigated as functions of the neutron fluence, gamma-ray dose, and dose …

Origin of irradiation synergistic effects in silicon bipolar transistors

Y Song, SH Wei - ACS Applied Electronic Materials, 2020 - ACS Publications
The practical damage of silicon bipolar devices subjected to mixed ionization and
displacement irradiations is usually evaluated by the sum of separated ionization and …