The atomic force microscope (AFM) system has evolved into a useful tool for direct
measurements of micro-structural parameters and unraveling the intermolecular forces at …

The focused ion beam (FIB) is a powerful piece of technology which has enabled scientific
and technological advances in the realization and study of micro-and nano-systems in many …

Focused ion beams with diameters of 8 to 50 nm are used for material processing in the
nanoscale regime. In this paper, effects of the ion beam–solid interaction determining the …

The statistics of electrical breakdown field (E bd) of Hf O 2 and Si O 2 thin films has been
evaluated over multiple length scales using macroscopic testing of standardized metal-oxide …

Nanomanufactured products with higher complexities in function, materials, scales and their
integration demand an increasing need for advanced manufacturing tools. It is driven by …

The influence of the probe tip type on the electrical oxide thickness result was researched for
four differently coated conductive tip types using SiO2 (oxide) films with optical thickness of …

The effects of H 2 O vapor introduced during focused ion beam (FIB) milling of diamond
(100) are examined. In particular, we determine the yield, surface morphology, and …

Conductive atomic force microscopy (CAFM) has become the preferred tool of many
companies and academics to analyze the electronic properties of materials and devices at …

The dominance of surface effects at the nanoscale implies that nanotechnology applications
involving contacting, moving components can be critically limited by the tribological behavior …

A conductive atomic force microscope (C-AFM) has been used to investigate the
degradation and breakdown of ultrathin (< 6 nm) films of SiO 2 at a nanometric scale …