Digital circuit design challenges and opportunities in the era of nanoscale CMOS

BH Calhoun, Y Cao, X Li, K Mai… - Proceedings of the …, 2008 - ieeexplore.ieee.org
Well-designed circuits are one key ldquoinsulatingrdquo layer between the increasingly
unruly behavior of scaled complementary metal-oxide-semiconductor devices and the …

[图书][B] Memory systems: cache, DRAM, disk

B Jacob, D Wang, S Ng - 2010 - books.google.com
Is your memory hierarchy stopping your microprocessor from performing at the high level it
should be? Memory Systems: Cache, DRAM, Disk shows you how to resolve this problem …

Improving GPU performance via large warps and two-level warp scheduling

V Narasiman, M Shebanow, CJ Lee… - Proceedings of the 44th …, 2011 - dl.acm.org
Due to their massive computational power, graphics processing units (GPUs) have become
a popular platform for executing general purpose parallel applications. GPU programming …

[PDF][PDF] CACTI 5.1

S Thoziyoor, N Muralimanohar, JH Ahn, NP Jouppi - 2008 - researchgate.net
CACTI 5.1 is a version of CACTI 5 fixing a number of small bugs in CACTI 5.0. CACTI 5 is
the latest major revision of the CACTI tool for modeling the dynamic power, access time …

Clock rate versus IPC: The end of the road for conventional microarchitectures

V Agarwal, MS Hrishikesh, SW Keckler… - Proceedings of the 27th …, 2000 - dl.acm.org
The doubling of microprocessor performance every three years has been the result of two
factors: more transistors per chip and superlinear scali ng of the processor clock with …

[PDF][PDF] Cacti 3.0: An integrated cache timing, power, and area model

P Shivakumar, NP Jouppi - 2001 - cs.utexas.edu
CACTI 3.0 is an integrated cache access time, cycle time, area, aspect ratio, and power
model. By integrating all these models together users can have confidence that tradeoffs …

Scaling trends of digital single-event effects: A survey of SEU and SET parameters and comparison with transistor performance

D Kobayashi - IEEE Transactions on Nuclear Science, 2020 - ieeexplore.ieee.org
The history of integrated circuit (IC) development is another record of human challenges
involving space. Efforts have been made to protect ICs from sudden malfunctions due to …

Multi-bit error tolerant caches using two-dimensional error coding

J Kim, N Hardavellas, K Mai, B Falsafi… - 40th Annual IEEE/ACM …, 2007 - ieeexplore.ieee.org
In deep sub-micron ICs, growing amounts of on-die memory and scaling effects make
embedded memories increasingly vulnerable to reliability and yield problems. As scaling …

Dark memory and accelerator-rich system optimization in the dark silicon era

A Pedram, S Richardson, M Horowitz… - IEEE Design & …, 2016 - ieeexplore.ieee.org
Unlike traditional dark silicon works that attack the computing logic, this article puts a focus
on the memory part, which dissipates most of the energy for memory-bound CPU …

A comprehensive memory modeling tool and its application to the design and analysis of future memory hierarchies

S Thoziyoor, JH Ahn, M Monchiero… - ACM SIGARCH …, 2008 - dl.acm.org
In this paper we introduce CACTI-D, a significant enhancement of CACTI 5.0. CACTI-D adds
support for modeling of commodity DRAM technology and support for main memory DRAM …