Understanding the degradation mechanism of organic light-emitting diodes (OLED) is
essential to improve device performance and stability. OLED failure, if not process-related …

This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-
SIMS) for high-resolution surface analysis and characterization of materials. While providing …

ToF-SIMS imaging with argon cluster sputter depth profiling has provided detailed insight
into the three-dimensional (3D) chemical composition of a series of polymer multilayer …

Mass spectrometry imaging (MSI) determines the spatial distribution of thousands of
molecules and chemical species simultaneously and has emerged as a powerful suite of …

Silicon carbide (SiC) is a wide bandgap semiconductor suitable for high-voltage, high-power
and high-temperature applications. However, the production of advanced SiC power …

Triarylamine groups have been widely utilized in the development of high-performance
charge-transporting or luminescent materials for fabricating organic light-emitting diodes …

The investigation of interface effects in hybrid organic/inorganic electronic and photonic
devices is a key step for improving their performance and operation stability. Depth profile …

Soft cluster-induced desorption/ionization of polystyrene oligomers was investigated with
respect to application in mass spectrometry. Clear peak progressions corresponding to …

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a high performance tool for
molecular depth profiling of polymer films, in particular when they are structured in …

We present a new method, fast and low demanding in terms of CPU performances, which is
able to extract latent chemical information from ToF-SIMS big data sets, such as those …