A review of thermoreflectance techniques for characterizing wide bandgap semiconductors' thermal properties and devices' temperatures

C Yuan, R Hanus, S Graham - Journal of Applied Physics, 2022 - pubs.aip.org
Thermoreflectance-based techniques, such as pump–probe thermoreflectance (pump–
probe TR) and thermoreflectance thermal imaging (TTI), have emerged as the powerful and …

Thermoreflectance spectroscopy—Analysis of thermal processes in semiconductor lasers

D Pierścińska - Journal of Physics D: Applied Physics, 2017 - iopscience.iop.org
This review focuses on theoretical foundations, experimental implementation and an
overview of experimental results of the thermoreflectance spectroscopy as a powerful …

Quantitative study on thermoreflectance linear relation

B Meng, Y Ma, X Wang, C Yuan - Journal of Applied Physics, 2023 - pubs.aip.org
Standard thermoreflectance-based measurements have been routinely taken on thin metal
transducer (Au or Al) deposited samples. This is based on the fundamental hypothesis that …

Formation of a-type dislocations near the InGaN/GaN interface during post-growth processing of epitaxial structures

J Moneta, G Staszczak, E Grzanka… - Journal of Applied …, 2023 - pubs.aip.org
Cross-sectional transmission electron microscopy studies often reveal a-type dislocations
located either below or above the interfaces in InGaN/GaN structures deposited along the …

[HTML][HTML] Developments on thermometric techniques in probing micro-and nano-heat

R Qian, X Gong, H Xue, W Lu, L Zhu… - ES Energy & …, 2019 - espublisher.com
Temperature is always of fundamental importance in various microscopic systems ranging
from solid state nano-devices physics, chemical micro-reactions and biological cells. As …

Dynamic device characteristics and linewidth measurement of InGaN/GaN laser diodes

S Gwyn, S Watson, T Slight, M Knapp… - IEEE Photonics …, 2020 - ieeexplore.ieee.org
We report on the characterization and analysis of a GaN-based distributed feedback laser
diode (DFB-LD) with 3 rd-order laterally etched sidewall gratings centered at a wavelength …

Time resolved Fabry-Perot measurements of cavity temperature in pulsed QCLs

S Gundogdu, HS Pisheh, A Demir, M Gunoven… - Optics express, 2018 - opg.optica.org
Temperature rise during operation is a central concern of semiconductor lasers and
especially difficult to measure during a pulsed operation. We present a technique for in situ …

Thermoreflectance Spectroscopy Technique: An Advanced Tool for Investigation of Thermal Phenomena in Semiconductor Devices

D Pierścińska, A Krząstek, M Nagowski… - 2024 24th …, 2024 - ieeexplore.ieee.org
This paper presents the results of the analysis of thermal processes and degradation
mechanisms in semiconductor devices: semiconductor lasers, quantum cascade lasers …

[PDF][PDF] Formation of a-type dislocations in GaN adjacent to InGaN epilayer at lateral free surfaces of InGaN/GaN heterostructures

J Moneta, G Staszczak, E Grzanka, P Tauzowski… - papers.ssrn.com
In this work we show that elastic relaxation of lateral free surfaces of InGaN epilayer may
induce plastic deformation of adjacent GaN resulted in introduction of a-type dislocations …

[PDF][PDF] Theoretical Thermal Characterization of 1.55 µm InGaN Quantum Well Lasers

MJ Islam, MR Islam, MM Hossain - researchgate.net
The thermal modeling for 1.55 μm InGaN based quantum-well heterostructure lasers is
presented. The power conversion efficiency, output light power, and their temperature …