Surface chemistry of atomic layer deposition: A case study for the trimethylaluminum/water process

RL Puurunen - Journal of applied physics, 2005 - pubs.aip.org
Atomic layer deposition (ALD), a chemical vapor deposition technique based on sequential
self-terminating gas–solid reactions, has for about four decades been applied for …

[HTML][HTML] Understanding chemical and physical mechanisms in atomic layer deposition

NE Richey, C De Paula, SF Bent - The Journal of chemical physics, 2020 - pubs.aip.org
Atomic layer deposition (ALD) is a powerful tool for achieving atomic level control in the
deposition of thin films. However, several physical and chemical phenomena can occur …

Formation of metal oxide particles in atomic layer deposition during the chemisorption of metal chlorides: a review

RL Puurunen - Chemical Vapor Deposition, 2005 - Wiley Online Library
As has been known for a decade, metal oxide particles can form in a single reaction of
gaseous metal chlorides with solid oxides. This is an undesirable effect in the fabrication of …

Mechanisms of LiCoO2 Cathode Degradation by Reaction with HF and Protection by Thin Oxide Coatings

JL Tebbe, AM Holder, CB Musgrave - ACS applied materials & …, 2015 - ACS Publications
Reactions of HF with uncoated and Al and Zn oxide-coated surfaces of LiCoO2 cathodes
were studied using density functional theory. Cathode degradation caused by reaction of HF …

Ozone-based atomic layer deposition of alumina from TMA: Growth, morphology, and reaction mechanism

SD Elliott, G Scarel, C Wiemer, M Fanciulli… - Chemistry of …, 2006 - ACS Publications
We examine the effect of growth temperature in the 150− 300° C range on the structural and
morphological properties of Al2O3 films deposited using atomic layer deposition, contrasting …

Delocalization errors in density functionals and implications for main-group thermochemistry

ER Johnson, P Mori-Sánchez, AJ Cohen… - The Journal of chemical …, 2008 - pubs.aip.org
The difficulty of approximate density functionals in describing the energetics of Diels–Alder
reactions and dimerization of aluminum complexes is analyzed. Both of these reaction …

First principles study of the atomic layer deposition of alumina by TMA–H 2 O-process

T Weckman, K Laasonen - Physical Chemistry Chemical Physics, 2015 - pubs.rsc.org
Atomic layer deposition (ALD) is a coating technology used to produce highly uniform thin
films. Aluminiumoxide, Al2O3, is mainly deposited using trimethylaluminium (TMA) and …

Low temperature (< 100 C) deposition of aluminum oxide thin films by ALD with O3 as oxidant

SK Kim, SW Lee, CS Hwang, YS Min… - Journal of The …, 2006 - iopscience.iop.org
Abstract films were deposited by atomic layer deposition (ALD) using trimethylaluminum and
as precursor and oxidant, respectively, at growth temperatures ranging from room …

Atomic-scale simulation of ALD chemistry

SD Elliott - Semiconductor Science and Technology, 2012 - iopscience.iop.org
Published papers on atomic-scale simulation of the atomic layer deposition (ALD) process
are reviewed. The main topic is reaction mechanism, considering the elementary steps of …

Mechanism of Precursor Blocking by Acetylacetone Inhibitor Molecules during Area-Selective Atomic Layer Deposition of SiO2

MJM Merkx, TE Sandoval, DM Hausmann… - Chemistry of …, 2020 - ACS Publications
Area-selective atomic layer deposition (ALD) is currently attracting significant interest as a
solution to the current challenges in alignment that limit the development of sub-5 nm …