[PDF][PDF] Кремний-германиевые наноструктуры с квантовыми точками: механизмы образования и электрические свойства

ОП Пчеляков, ЮБ Болховитянов… - Физика и техника …, 2000 - journals.ioffe.ru
На основе анализа публикаций последних лет для системы Ge-на-Si приводятся
устоявшиеся представления о механизмах образования германиевых островков …

Silicon-germanium nanostructures with quantum dots: Formation mechanisms and electrical properties

OP Pchelyakov, YB Bolkhovityanov, AV Dvurechenskii… - Semiconductors, 2000 - Springer
The generally accepted notions about the formation mechanisms for germanium islands with
nanometer-scale sizes in a Ge-on-Si system are reviewed on the basis of analysis of recent …

Extremely dense arrays of germanium and silicon nanostructures

AA Shklyaev, M Ichikawa - Physics-Uspekhi, 2008 - iopscience.iop.org
Results of investigations into surface processes of the formation of germanium and silicon
nanostructures are analyzed. A mechanism of three-dimensional island nucleation and …

Dewetting behavior of Ge layers on SiO2 under annealing

AA Shklyaev, AV Latyshev - Scientific Reports, 2020 - nature.com
The solid-state dewetting phenomenon in Ge layers on SiO2 is investigated as a function of
layer thickness d Ge (from 10 to 86 nm) and annealing temperature. The dewetting is …

Two-dimensional periodic alignment of self-assembled Ge islands on patterned Si (001) surfaces

T Kitajima, B Liu, SR Leone - Applied physics letters, 2002 - pubs.aip.org
Two-dimensional alignment of Ge islands is obtained by molecular beam epitaxy of Ge on
lithographically patterned Si (001) surfaces composed of periodic arrays of square Si mesas …

Coatings consisting of Ge particles on nonwettable Si oxide surfaces and their resonance reflection spectra

AA Shklyaev - Thin Solid Films, 2023 - Elsevier
The dewetting phenomenon that occurs during annealing of Ge films after their deposition
on oxidized Si surfaces at room temperature is studied. The agglomeration of Ge films into …

Nanolithography on SiO2/Si with a scanning tunnelling microscope

H Iwasaki, T Yoshinobu, K Sudoh - Nanotechnology, 2003 - iopscience.iop.org
This paper gives a brief review of our recent work on a new method of nanoscale pattern
formation of thin oxide film on Si substrate by using a scanning tunnelling microscope (STM) …

Предельно плотные массивы наноструктур германия и кремния

АА Шкляев, М Ичикава - Успехи физических наук, 2008 - ufn.ru
Создание полупроводниковых структур с новыми физическими свойствами является
основной задачей нанотехнологии, имеющей целью расширение пределов …

Surface morphology of Ge layers epitaxially grown on bare and oxidized Si (001) and Si (111) substrates

AA Shklyaev, KN Romanyuk, SS Kosolobov - Surface science, 2014 - Elsevier
The surface morphology of Ge layers grown by Ge deposition on the Si (001) and Si (111)
surfaces covered with ultrathin SiO 2 films is studied with scanning tunneling microscopy. It …

Ge islands on Si (111) at coverages near the transition from two-dimensional to three-dimensional growth

AA Shklyaev, M Shibata, M Ichikawa - Surface science, 1998 - Elsevier
We use scanning reflection electron microscopy (SREM) to study three-dimensional Ge
island formation on the Si (111) surface at coverages near the transition from two …