We present a resilience analysis framework, called FIdelity, to accurately and quickly
analyze the behavior of hardware errors in deep learning accelerators. Our framework …

This paper discusses principles and techniques to evaluate processors for dependable
computing in space applications. The focus is on soft errors, which dominate the failure rate …

As Deep Neural Networks (DNNs) are increasingly deployed in safety critical and privacy
sensitive applications such as autonomous driving and biometric authentication, it is critical …

A flip-flop circuit hardened against soft errors is presented in this paper. This design is an
improved version of Quatro for further enhanced soft-error resilience by integrating the guard …

Experimental results from alpha particle irradiation of 40-nm, 28-nm and 20-nm bulk
technology circuits operating in the GHz range suggest that the combinational logic soft error …

This article presents the design, implementation methodology, and validation of a multi-bit
flip-flop (FF) system that provides tolerance against single-event upsets (SEUs) and single …

Alpha particle irradiations of 28-nm combinational logic and flip-flop circuits under different
supply voltage and frequency operating conditions are investigated. Results indicate that …

Heavy-ion experimental results from flip-flops in 180-nm to 28-nm bulk technologies are
used to quantify single-event upset trends. The results show that as technologies scale, D …

This paper presents an SEU-tolerant Dual Interlocked Storage Cell (DICE) latch design with
both PMOS and NMOS transistors in the feedback paths. The feedback transistors improve …

Threshold voltage (VT) of transistors plays an important role in single-event upsets (SEU)
and system power consumption. Effect of VT on single-event upsets can be very different for …