Current status of reliability in extended and beyond CMOS devices

AE Islam - IEEE Transactions on Device and Materials …, 2014 - ieeexplore.ieee.org
In the history of electronics, solid-state materials replaced the vacuum parts to reduce power
consumption and to obtain better reliability at a reduced cost. The size of solid-state …

Influence of process parameter on carbon nanotube field effect transistor using response surface methodology

M SundaramK, P Prakash… - Journal of …, 2021 - Wiley Online Library
Carbon nanotube field‐effect transistor (CNTFET) is a good option to replace silicon for low
power consumption application. Recent research shows that CN‐FET thermal and electrical …

Variability and reliability of single-walled carbon nanotube field effect transistors

AE Islam - Electronics, 2013 - mdpi.com
Excellent electrical performance and extreme sensitivity to chemical species in
semiconducting Single-Walled Carbon NanoTubes (s-SWCNTs) motivated the study of …

Radiation-hard complementary integrated circuits based on semiconducting single-walled carbon nanotubes

JJ McMorrow, CD Cress, WA Gaviria Rojas, ML Geier… - ACS …, 2017 - ACS Publications
Increasingly complex demonstrations of integrated circuit elements based on
semiconducting single-walled carbon nanotubes (SWCNTs) mark the maturation of this …

Radiation-hard and repairable complementary metal–oxide–semiconductor circuits integrating n-type indium oxide and p-type carbon nanotube field-effect transistors

M Luo, M Zhu, M Wei, S Shao, M Robin… - … Applied Materials & …, 2020 - ACS Publications
Special radiation-hard and ultralow-power complementary metal–oxide–semiconductor
(CMOS) integrated circuits (ICs) are used in the fields of deep space, nuclear energy, and …

Total ionizing dose hardened and mitigation strategies in deep submicrometer CMOS and beyond

E Chatzikyriakou, K Morgan… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
From man-made satellites and interplanetary missions to fusion power plants, electronic
equipment that needs to withstand various forms of irradiation is an essential part of their …

[HTML][HTML] Improving the radiation hardness of graphene field effect transistors

K Alexandrou, A Masurkar, H Edrees… - Applied Physics …, 2016 - pubs.aip.org
Ionizing radiation poses a significant challenge to the operation and reliability of
conventional silicon-based devices. Here, we report the effects of gamma radiation on …

Radiation sensor design for mitigation of total ionizing dose effects

S Anjankar, R Dhavse - Advances in VLSI and Embedded Systems: Select …, 2022 - Springer
The electrical breakdown of oxides and oxide/semiconductor interfaces is one of the major
reasons for failure of CMOS ICs, especially when they are exposed to high stress conditions …

Total ionizing dose induced charge carrier scattering in graphene devices

CD Cress, JG Champlain, IS Esqueda… - … on Nuclear Science, 2012 - ieeexplore.ieee.org
We investigate total ionizing dose (TID) effects in graphene field effect transistors comprised
of chemical vapor deposition grown graphene transferred onto trimethylsiloxy (TMS) …

Radiation effects in carbon nanoelectronics

CD Cress, JJ McMorrow, JT Robinson, BJ Landi… - Electronics, 2012 - mdpi.com
We experimentally investigate the effects of Co-60 irradiation on the electrical properties of
single-walled carbon nanotube and graphene field-effect transistors. We observe significant …