Recent advances and new trends in flip chip technology
JH Lau - Journal of Electronic Packaging, 2016 - asmedigitalcollection.asme.org
Recent advances in flip chip technology such as wafer bumping, package substrate, flip chip
assembly, and underfill will be presented in this study. Emphasis is placed on the latest …
assembly, and underfill will be presented in this study. Emphasis is placed on the latest …
Effect of particle shape of silica mineral on the properties of epoxy composites
This study was carried out to evaluate the performance of silica mineral composites in
comparison with conventional fused silica composites, which is commonly used as underfill …
comparison with conventional fused silica composites, which is commonly used as underfill …
Reliability analysis and design for the fine-pitch flip chip BGA packaging
CT Peng, CM Liu, JC Lin, HC Cheng… - IEEE Transactions on …, 2004 - ieeexplore.ieee.org
The geometry of solder joints in the flip chip technologies is primarily determined by the
associated solder volume and die/substrate-side pad size. In this study, the effect of these …
associated solder volume and die/substrate-side pad size. In this study, the effect of these …
Study of package warp behavior for high-performance flip-chip BGA
Y Sawada, K Harada, H Fujioka - Microelectronics Reliability, 2003 - Elsevier
To meet the future needs of high pin count and high performance, the LSI die and package
size of flip-chip BGA (FC-BGA) devices have become larger. As a result, package warpage …
size of flip-chip BGA (FC-BGA) devices have become larger. As a result, package warpage …
Solder reflow process induced residual warpage measurement and its influence on reliability of flip-chip electronic packages
SY Yang, YD Jeon, SB Lee, KW Paik - Microelectronics Reliability, 2006 - Elsevier
To meet the future needs of high pin count and high performance, package size of flip-chip
devices is constrained to become larger. In addition, to fulfill the environment issues, lead …
devices is constrained to become larger. In addition, to fulfill the environment issues, lead …
On the influence of lid materials for flip-chip ball grid array package applications
MB Jeronimo, J Schindele, H Straub, PJ Gromala… - Microelectronics …, 2023 - Elsevier
Autonomous driving is a key vehicle capability for future mobility solutions that relies on the
reliability of its high-performance vehicle computer. As for any electronics for automotive …
reliability of its high-performance vehicle computer. As for any electronics for automotive …
Modeling of flip-chip underfill delamination and cracking with five input manufacturing variables
The chip corner geometry and the mismatch of the coefficient of thermal expansion cause a
local stress concentration in the underfill near the chip corner area. Delamination at the chip …
local stress concentration in the underfill near the chip corner area. Delamination at the chip …
The effect of mineral surface nature on the mechanical properties of mineral-filled polypropylene composites
AA El-Midany, SS Ibrahim - Polymer bulletin, 2010 - Springer
The adhesion between the polymer matrix and the inorganic filler particles are the goal of
various and tremendous studies. This issue is still occupying a big part of the researchers …
various and tremendous studies. This issue is still occupying a big part of the researchers …
Underfill constraint effects during thermomechanical cycling of flip-chip solder joints
I Dutta, A Gopinath, C Marshall - Journal of Electronic Materials, 2002 - Springer
The presence of an “underfill” encapsulant between a microelectronic device and the
underlying substrate is known to substantially improve the thermal fatigue life of flip-chip …
underlying substrate is known to substantially improve the thermal fatigue life of flip-chip …
<? Pub Dtl=""?> Thermal Fatigue of SnPb and SAC Resistor Joints: Analysis of Stress-Strain as a Function of Cycle Parameters
Y Qi, HR Ghorbani, JK Spelt - IEEE Transactions on Advanced …, 2006 - ieeexplore.ieee.org
Accelerated thermal cycling (ATC) has been widely used in the microelectronics industry for
reliability assessment. The relative effects of thermal cycling parameters (temperature range …
reliability assessment. The relative effects of thermal cycling parameters (temperature range …