Dielectric constant measurement sensitivity in electrostatic force and force gradient microscopy-based modes
G Stan - Journal of Applied Physics, 2023 - pubs.aip.org
Understanding the nanoscale electrostatic interaction between a conductive atomic force
microscopy (AFM) probe and a dielectric film is central to the operation of various nanoscale …
microscopy (AFM) probe and a dielectric film is central to the operation of various nanoscale …
[HTML][HTML] Calculating electrostatic interactions in atomic force microscopy with semiconductor samples
J Xu, J Li, W Li - AIP Advances, 2019 - pubs.aip.org
Electrostatic interactions are important in non-contact atomic force microscopy (AFM)
measurement. Previous reports had focused on the calculation of electrostatic interactions in …
measurement. Previous reports had focused on the calculation of electrostatic interactions in …
Evolution of millimetric-range electrostatic forces between an AFM cantilever and a charged dielectric via suspended force curves
T Lai, M Guo, Y Chen - The Journal of Adhesion, 2022 - Taylor & Francis
The evolution of millimetric-range electrostatic force between a silicon cantilever and a
negatively charged dielectric sample was studied by recording “suspended” force curves at …
negatively charged dielectric sample was studied by recording “suspended” force curves at …
Thickness‐Dependent Relative Dielectric Constant of Organic Ultrathin Films
In formulas employed for analysis of organic electronic devices, the relative dielectric
constant value of the semiconductor organic films is often assumed rather than measured …
constant value of the semiconductor organic films is often assumed rather than measured …