Ml-based aging monitoring and lifetime prediction of iot devices with cost-effective embedded tags for edge and cloud operability
AR Shamshiri, MB Ghaznavi-Ghoushchi… - IEEE Internet of …, 2021 - ieeexplore.ieee.org
The growing number of smart connected devices raises challenges in system reliability.
Prediction of failures in Internet of Things (IoT) ecosystems is a significant problem …
Prediction of failures in Internet of Things (IoT) ecosystems is a significant problem …
Linearity Improvement of VCO-Based ADC via Complementary Bias Voltage Control for IoT Devices
P Srikram, M Ikebe, M Motomura - Journal of Signal Processing, 2022 - jstage.jst.go.jp
1@ K BH, &bBFKXTi-BF2# 2'! BbiX? QFm/BX+ XDT-KQiQKm!iB+ XBBXiBi2+? X+ XDT# bi+ i
_BM;@ o* P UoQHi; 2+ QMiQHH2/Qb+ BHH iQV@# b2/.* b2 bmBi# H2 7Qi …
_BM;@ o* P UoQHi; 2+ QMiQHH2/Qb+ BHH iQV@# b2/.* b2 bmBi# H2 7Qi …